Instrument Database

Illustration of surface/interface, subsurface, volume, and geometric dimensions of a cube.

MAPEX Instrument Database

You can search the MAPEX Instrument Database using the search field or one of the drop down menus providing the following categories:

Classic CategoriesMAPEX Categories
MicroscopySurface/Interface Characterization
Surface CharacterizationSurface/Near-Surface Properties
SpectroscopyVolume Properties
DiffractionGeometric/Dimensional Properties

Last added instruments

  • LEEMLEEM
  • Titan 80-300 STTitan 80-300 ST
  • Atomic Force MicroscopeAtomic Force Microscope
  • Interferometer-Raman combinationInterferometer-Raman combination
  • Xradia 520 VersaXradia 520 Versa
Service Electron Microscopy

Kontakt und Registrierung der Instrumente

Dr. Hanna Lührs
Tel: +49 (0)421-218-64580
E-Mail: MAPEX

Registrierungsformular (Excel) [XLSX] (153 KB)

Instrument Manufacturer Category Contact
(S)TEM FEI
  • Diffraction
  • Spectroscopy
  • Electron Microscopy
  • Dimensional Properties
  • Surface / Interface Characterization
  • Material Properties
  • Thorsten Mehrtens
  • Marco Schowalter
3D Profilometer Sensofar-Tech, S.L.
  • Dimensional Properties
  • Jürgen Horvath
AFM JPK Berlin Germany
  • Surface Analytics
  • Spectroscopy
  • Surface / Interface Characterization
  • Material Properties
  • Dimensional Properties
  • Gang Wei
  • Jingfeng Li
BET MicrotracBEL Corp.
  • Surface Analytics
  • Surface / Interface Characterization
  • Prabu Moni
BSM Malvern
  • Diffraction
  • Dimensional Properties
  • Daniel Schwenck
  • Nevaf Ciftci
CD spectrometer Applied Photophysics
  • Spectroscopy
  • Surface / Interface Characterization
  • Monika Michaelis
EMPA JEOL
  • Surface Analytics
  • Spectroscopy
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Herbert Juling
FastScanning AFM Bruker
  • Surface Analytics
  • Surface / Interface Characterization
  • Material Properties
  • Andreas Lüttge
  • Cornelius Fischer
FIB Zeiss
  • Electron Microscopy
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Thorsten Klein
  • Reiner Klattenhoff
G3 Malvern
  • Dimensional Properties
  • Nils Ellendt
  • Daniel Schwenck
Gleeble 3500 Dynamic Systems
  • Material Properties
  • Andree Irretier
  • Münip Dalgic
He pygnometer Porotec
  • Material Properties
  • Tina Kühn
Hg porosimeter POROTEC GmbH
  • Material Properties
  • Tina Kühn
IPDS Stoe & Cie
  • Diffraction
  • Material Properties
  • Lars Robben
Laser Flash Unit NETZSCH-Gerätebau GmbH
  • Material Properties
  • Christian Ellenberg
LEEM Elmitec
  • Diffraction
  • Electron Microscopy
  • Surface / Interface Characterization
  • Jan Ingo Flege
  • Jens Falta
Rheometer DHR-3 TA Instruments
  • Material Properties
  • Surface / Interface Characterization
  • Michael Maas
  • Tobias Bollhorst
Rheometer Kinexus Malvern
  • Material Properties
  • Michael Maas
  • Tobias Bollhorst
SEM Jeol
  • Material Properties
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Lars Robben
STA Netzsch
  • Material Properties
  • Michael Wendschuh
STA Bähr-Thermoanalyse GmbH
  • Material Properties
  • Huixing Zhang
  • Tina Kühn
StadiP Stoe & Cie
  • Diffraction
  • Material Properties
  • Lars Robben
STM/XPS/LEED Omicron
  • Diffraction
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Jens Falta
  • Jon-Olaf Krisponeit
SurPASS Anton Paar
  • Surface Analytics
  • Material Properties
  • Surface / Interface Characterization
  • Gesa Hollermann
VSI-R Bruker/Renishaw
  • Surface Analytics
  • Spectroscopy
  • Surface / Interface Characterization
  • Material Properties
  • Andreas Lüttge
  • Cornelius Fischer
X-ray CT GE
  • Material Properties
  • Dimensional Properties
  • Surface / Interface Characterization
  • Christian Kapitza
XRD powder Panalytical
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Michael Wendschuh
  • Johannes Birkenstock
XRD powder Bruker
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Michael Wendschuh
  • Johannes Birkenstock
XRD powder GE Sensing & Inspection Technologies GmbH
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Victor Lauth
  • Christian Ellenberg
XRD single crystal Bruker
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Johannes Birkenstock
  • Michael Wendschuh
XRD single crystal Bruker
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Enno Lork
XRM ZEISS
  • Material Properties
  • Dimensional Properties
  • Surface / Interface Characterization
  • Oliver Focke
Zetasizer Malvern
  • Surface Analytics
  • Dimensional Properties
  • Surface / Interface Characterization
  • Michael Maas
  • Victor Lauth