University of Bremen - ZEISS Xradia 520 Versa

60 University of Bremen - ZEISS Xradia 520 Versa https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa This page contains information about the 3D X-ray microscope ZEISS Xradia Versa 520 at the MAPEX Core Facility, University of Bremen. en University of Bremen Mon, 18 May 2026 08:17:14 +0200 Mon, 18 May 2026 08:17:14 +0200 University of Bremen content-370709 Wed, 04 Mar 2026 23:43:54 +0100 The scanner https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370709 Our ZEISS Xradia 520 Versa is equipped with a 160 <abbr title="kiloVolt">kV</abbr> micro focus X-ray source with maximum 10 <abbr title="Watt">W</abbr>. Due to a unique setup of scintillator and 16-bit CCD 2024 x 2024 pixel camera, magnification is achieved by a two-stage technique including a microscope objective system. This enables a beam path through the sample with very little divergence, which is allows large working distance at high resolutions. The standard imaging mode of the <abbr title="X-ray microscopy">XRM</abbr> can be modified to offer several additional imaging techniques. Content content-370710 Wed, 04 Mar 2026 23:43:54 +0100 The method https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370710 The method is based on the detection and localisation of the degree of attenuation of the incident X-rays in the sample. The attenuation of X-rays by matter depends on both the chemical elements it consists of as well as the material density. The information about the varied X-ray absorption in encoded as grey values in a stack of black-and-white images. Each image consists of voxels (volumetric pixels) and contains true volumetric information. Content content-370711 Wed, 04 Mar 2026 23:43:54 +0100 Sample types and preparation https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370711 X-ray microscopy can characterize all materials that are transparent for X-rays, <abbr title="for example">e.g</abbr> bio-materials, polymers, fiber textile materials, ceramics, semiconductors, rocks, or metals. The sample surface does not have to be prepared in advance. In our lab we analyze biological samples (<abbr title="for example">e.g</abbr> , grashopper's legs, cotton), fiber composite materials, hot spring silica sinters, metal powders, and many more. Content content-370708 Wed, 04 Mar 2026 23:43:54 +0100 Sample size and - geometry https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370708 In general, samples of any shape can be investigated. Although a cylindrical shape is most favorable for X-ray microscopy, also thin or flat pieces can be imaged with a scan mode optimized for a samples with a&nbsp;high aspect ratio. Sample size may range from a few millimeter to several centimeters. Most important for a successful scan is a sufficient transmission of the object for X-rays. It is also possible to scan selected sectors of a sample. Content content-370718 Wed, 04 Mar 2026 23:43:54 +0100 Phase contrast for low-z tomography https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370718 The distinct X-ray microscope beam optic allows to move both source and detector far from the sample while still achieving high magnification. This constellation engages the propagation phase contrast mode, which by detecting Fresnel diffraction fringes allows to image the interfaces of different patches or grains consisting of the same material. Content content-370717 Wed, 04 Mar 2026 23:43:54 +0100 Dual-energy scans separate similar z https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370717 On rare occasions, element content and density of materials match unfortunate to be indistinguishable by a single-energy scan. In these cases, a distinct segmentation can be attained by a software-guided process combining the outcome of a low-energy scan (where X-ray absorption is dominated by photoelectric effect) and a high-energy scan (here X-ray absorption is mostly determined by Compton scattering). Content content-370716 Wed, 04 Mar 2026 23:43:54 +0100 Diffraction contrast tomography (DCT) https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370716 Laboratory <abbr title="Diffraction contrast tomography">DCT</abbr> is performed by adding an aperture and beamstop to the X-ray path in order to acquire diffraction patterns of crystalline materials. In combination with a standard absorption tomography, <abbr title="Three dimensional">3D</abbr> crystallographic information such as grain size, shape and orientation can be retrieved. Sample should be roughly 1-2 <abbr title="Millimeter">mm</abbr>&nbsp;in size. For LAB-<abbr title="Diffraction contrast tomography">DCT</abbr> observations, the <abbr title="X-ray microscopy">XRM</abbr> personnel will modify the XRM beam setup, and will accompany the measurements. Content content-370715 Wed, 04 Mar 2026 23:43:54 +0100 Deben mechanical test stage https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370715 The <abbr title="X-ray microscopy">XRM</abbr> lab is equipped with a Deben mechanical testing stage, which allows X-ray microsopy surveillance of in-situ experiments in one of the three modes: Compression, tension, and indentation. For mechanical in-situ observations, the <abbr title="X-ray microscopy">XRM</abbr> personnel will modify the XRM sample setup to host the testing stage, and will accompany the mechanical testing experiments. Content content-370722 Wed, 04 Mar 2026 23:43:54 +0100 What resolution can I expect? https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370722 Relevant for the attainable resolution in a <abbr title="X-ray microscopy">XRM</abbr> beam geometry is actually the sample's overall transmissivity for X-rays, which for a given piece is mostly linked to the sample size. In general, very small samples (1-3 <abbr title="Millimeter">mm</abbr>) can be characterised with high resolution (0.3 - 0.7 <abbr title="Micrometer">µm</abbr> per voxel), and larger samples (10-50 <abbr title="Millimeter">mm</abbr>) with lower resolution (3-25 <abbr title="Micrometer">µm</abbr>&nbsp;per voxel). Content content-370721 Wed, 04 Mar 2026 23:43:54 +0100 What kind of result do I get? https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370721 The result is the reconstructed spatial distribution of X-ray attenuation within the object, in the form of a digital image stack or as image volume, which can be downloaded from the lab server. A storage medium will not be provided. In addition, the transmission images can be supplied. An&nbsp;analysis of the tomography data is possible in the context of a scientific cooperation. Content content-370720 Wed, 04 Mar 2026 23:43:54 +0100 Contact https://www.uni-bremen.de/en/mapex-cf/instrumentation/3d-materials-analytics/zeiss-xradia-520-versa#c370720 Contact person for technical information <abbr title="Doctor">Dr.</abbr> Wolf-Achim Kahl Analytical service Requests for analyse services are welcome for both academic and non-commercial customers. Please contact <abbr title="Professor Doktor Ingenieur">Prof. Dr.-Ing.</abbr> Lucio Colombi Ciacchi (e-mail: <a class="mail" href="mailto:colombi@uni-bremen.de">colombi@uni-bremen.de</a>) or&nbsp; <abbr title="Doctor">Dr.</abbr> Wolf-Achim Kahl (e-mail: <a class="mail" href="mailto:wakahl@uni-bremen.de">wakahl@uni-bremen.de</a>). For&nbsp;usage&nbsp;regulations&nbsp;of X-ray microscope follow the link: Content