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Infrastructure

The database facilitates scientific work by offering a searchable list of analytical equipment available in the group of MAPEX members. The online database is aimed at making it easier for students, university employees as well as external researchers to learn about analytical methods and get in contact with the responsible Instrument operators. You can easliy browse through the predefined categories or perform keyword and text searches.

 

Last added instruments

Contact and registration of instruments

Dr. Hanna Lührs

Phone: +49 (0)421-218-64580
E-Mail: MAPEX
 

registration form (Excel)

Service Electron Microscopy



Principal Investigator

 Andreas Rosenauer

Instrument Manufacturer Category Contact
(S)TEM FEI
  • Diffraction
  • Microscopy
  • Spectroscopy
  • Electron Microscopy
  • Dimensional Properties
  • Surface / Interface Characterization
  • Material Properties
  • Thorsten Mehrtens
  • Marco Schowalter
3D Laser Lithography Nanoscribe
  • ---
  • Material Properties
  • Surface / Interface Characterization
  • Dimensional Properties
  • Claas Falldorf
3D Profilometer Sensofar-Tech, S.L.
  • Microscopy
  • Dimensional Properties
  • Jürgen Horvath
Acoustic Emission Vallen Systeme GmbH
  • Damage analysis
  • Material Properties
  • Renato Almeida
AFM JPK Berlin Germany
  • Microscopy
  • Surface Analytics
  • Spectroscopy
  • Surface / Interface Characterization
  • Material Properties
  • Dimensional Properties
  • Gang Wei
  • Jingfeng Li
Axioplan Zeiss
  • ---
  • Surface / Interface Characterization
  • Johanne Hesselbach
  • Manuel Hahn
Axioskop Zeiss
  • ---
  • Surface / Interface Characterization
  • Johanne Hesselbach
  • Manuel Hahn
BET MicrotracBEL Corp.
  • Surface Analytics
  • Surface / Interface Characterization
  • Prabu Moni
BSM Malvern
  • Diffraction
  • Dimensional Properties
  • Daniel Schwenck
  • Nevaf Ciftci
CD spectrometer Applied Photophysics
  • Spectroscopy
  • Surface / Interface Characterization
  • Monika Michaelis
Confocal microscope Keyence
  • Microscopy
  • Surface Analytics
  • Dimensional Properties
  • Material Properties
  • Surface / Interface Characterization
  • Claas Falldorf
  • Reiner Klattenhoff
Creep testing machine Zwick
  • Mechanical testing
  • Material Properties
  • Jürgen Horvath
  • Renato Almeida
DMA TA Instruments
  • ---
  • Material Properties
  • Dimensional Properties
  • Johanne Hesselbach
  • Manuel Hahn
DSC TA Instruments
  • ---
  • Material Properties
  • Johanne Hesselbach
  • Manuel Hahn
E-beam lithography Raith
  • ---
  • Material Properties
  • Dimensional Properties
  • Surface / Interface Characterization
  • Reiner Klattenhoff
EMPA JEOL
  • Microscopy
  • Surface Analytics
  • Spectroscopy
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Herbert Juling
FastScanning AFM Bruker
  • Microscopy
  • Surface Analytics
  • Surface / Interface Characterization
  • Material Properties
  • Andreas Lüttge
  • Cornelius Fischer
Fatigue testing machine Roell Amsler
  • Mechanical testing
  • Material Properties
  • Renato Almeida
  • Jürgen Horvath
FIB Zeiss
  • Electron Microscopy
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Reiner Klattenhoff
  • Reiner Klattenhoff
FT-Raman Bruker
  • Spectroscopy
  • Material Properties
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Mangir M. Murshed
FTIR Bruker
  • Spectroscopy
  • Material Properties
  • Mangir M. Murshed
G3 Malvern
  • Microscopy
  • Dimensional Properties
  • Nils Ellendt
  • Daniel Schwenck
Gleeble 3500 Dynamic Systems
  • ---
  • Material Properties
  • Andree Irretier
  • Münip Dalgic
He pygnometer Porotec
  • ---
  • Material Properties
  • Tina Kühn
Hg porosimeter POROTEC GmbH
  • ---
  • Material Properties
  • Tina Kühn
Inspekt 100 Hegewald & Peschke
  • Surface Analytics
  • Material Properties
  • Michael Brink
IPDS Stoe & Cie
  • Diffraction
  • Material Properties
  • Lars Robben
Laser Flash Unit NETZSCH-Gerätebau GmbH
  • Characterization
  • Material Properties
  • Christian Ellenberg
LEEM Elmitec
  • Diffraction
  • Microscopy
  • Electron Microscopy
  • Surface / Interface Characterization
  • Max Mustermann
  • Jan Ingo Flege
  • Jens Falta
LEEM Elmitec
  • Diffraction
  • Microscopy
  • Electron Microscopy
  • Surface / Interface Characterization
  • Jan Ingo Flege
  • Jens Falta
LFA 457 Netzsch
  • ---
  • Material Properties
  • Johanne Hesselbach
  • Manuel Hahn
M420 Wild
  • ---
  • Surface / Interface Characterization
  • Johanne Hesselbach
  • Manuel Hahn
NDT GrindoSonic
  • Mechanical testing
  • Material Properties
  • Jürgen Horvath
  • Renato Almeida
Raman Horiba Jobin Yvon
  • Spectroscopy
  • Material Properties
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Mangir M. Murshed
Rheometer TA Instruments
  • ---
  • Material Properties
  • Dimensional Properties
  • Johanne Hesselbach
  • Manuel Hahn
Rheometer DHR-3 TA Instruments
  • ---
  • Material Properties
  • Surface / Interface Characterization
  • Michael Maas
  • Joeri Smits
  • Joeri Smits
Rheometer Kinexus Malvern
  • ---
  • Material Properties
  • Michael Maas
  • Jéssica Condi Mainardi
  • Jéssica Condi Mainardi
SEM Jeol
  • Microscopy
  • Material Properties
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Lars Robben
SEM Zeiss
  • Surface Analytics
  • Surface / Interface Characterization
  • Dimensional Properties
  • Eva-Maria Meyer
  • Daniel Gräbner
Spectrometry Lab
  • Characterization
  • Surface / Interface Characterization
  • Jérémy Epp
STA Netzsch
  • ---
  • Material Properties
  • Michael Wendschuh
STA Bähr-Thermoanalyse GmbH
  • ---
  • Material Properties
  • Daniel Schumacher
  • Tina Kühn
StadiP Stoe & Cie
  • Diffraction
  • Material Properties
  • Lars Robben
STM with LEED and XPS Omicron EA 125
  • Surface Analytics
  • Spectroscopy
  • Diffraction
  • Material Properties
STM/XPS/LEED Omicron
  • Microscopy
  • Characterization
  • Diffraction
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Jens Falta
  • Jon-Olaf Krisponeit
SurPASS Anton Paar
  • Surface Analytics
  • Material Properties
  • Surface / Interface Characterization
  • Marieke Hoog Antink
  • Joeri Smits
TGA Eltra
  • ---
  • Material Properties
  • Johanne Hesselbach
  • Manuel Hahn
TMA TA Instruments
  • ---
  • Material Properties
  • Dimensional Properties
  • Johanne Hesselbach
  • Manuel Hahn
VSI-R Bruker/Renishaw
  • Surface Analytics
  • Spectroscopy
  • Microscopy
  • Surface / Interface Characterization
  • Material Properties
  • Andreas Lüttge
  • Cornelius Fischer
X-ray CT GE
  • ---
  • Material Properties
  • Dimensional Properties
  • Surface / Interface Characterization
  • Christian Kapitza
X-Ray Lab
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Jérémy Epp
X-Ray Powder Stoe & Cie GmbH, Darmstadt
  • Diffraction
  • Surface / Interface Characterization
  • Lars Robben
XRD powder Panalytical
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Michael Wendschuh
  • Johannes Birkenstock
XRD powder Bruker
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Michael Wendschuh
  • Johannes Birkenstock
XRD powder
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
XRD powder GE Sensing & Inspection Technologies GmbH
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Marieke M. Hoog Antink
  • Christian Ellenberg
XRD single crystal Bruker
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Johannes Birkenstock
  • Michael Wendschuh
XRD single crystal Bruker
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Enno Lork
XRD single crystal, IPDS Stoe
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
XRM ZEISS
  • Microscopy
  • Material Properties
  • Dimensional Properties
  • Surface / Interface Characterization
  • Oliver Focke
Z 250 Zwick
  • ---
  • Material Properties
  • Johanne Hesselbach
  • Manuel Hahn
Z005 Zwick
  • Mechanical testing
  • Material Properties
  • Renato Almeida
  • Jürgen Horvath
Zetasizer Malvern
  • Surface Analytics
  • Dimensional Properties
  • Surface / Interface Characterization
  • Michael Maas
  • Joeri Smits
Updated by: MAPEX