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MAPEX Instrument Database

SEM

General information

Description
JSM-6510 SEM
Manufacturer
Jeol
Location
Fachbereich 2
IACK
Chemische Kristallographie fester Stoffe NW2 C3230
Category
Microscopy
MAPEX Category
Material Properties, Surface / Interface Characterization, Near- / Subsurface Properties
Keywords
SEM
Main Application
Scanning Electron Microscope
Features
SE and BE detectors; EDX detector for quantitative chemical analysis
Year of Fabrication
2011

Instrument specification

Specifications

Jeol JSM-6510 Scanning Electron Microscope with W-emitter (maximum resolution 3 nm @ 30 kV). Detectors: Secondary electrons; backscattered electrons; Bruker X-Flash solid state detector for X-ray spectroscopy, enabling qualitative and quantitative analysis, analysis along line profiles and sample mapping.

Contact

Contact person

Lars Robben
Fachbereich 2 / IACK
NW2/C3051
Phone 63142
lrobben@uni-bremen.de

Principal Investigator
Gesing, Thorsten
Updated by: MAPEX