Skip to main content

MAPEX Instrument Database

XRD single crystal

General information

Description
Bruker D8
Manufacturer
Bruker
Category
Diffraction
MAPEX Category
Near- / Subsurface Properties, Material Properties
Keywords
single crystal diffraction, XRD
Year of Fabrication
2014

Instrument specification

Specifications

microfocus source, from 100 K to 293K

Contact

Contact person

Enno Lork
Fachbereich 2
enno.lork@uni-bremen.de

Principal Investigator
Beckmann, Jens
Updated by: MAPEX