MAPEX Instrument Database

(S)TEM

General information

Description

Titan 80-300 ST

Manufacturer

FEI

Location

Fachbereich 1
IFP
AG Rosenauer NW1 O0050

Category

Diffraction, Microscopy, Spectroscopy, Electron Microscopy

MAPEX Category

Dimensional Properties, Surface / Interface Characterization, Material Properties

Keywords

HR(S)TEM, EELS, EFTEM, EDX, Nano beam electron diffraction, NBED, TEM

Measured Quantity

Morphological quantities, Elemental distribution, Strain distribution

Main Application

(Scanning) transmission electron microscopy

Features

Aberration corrector for imaging lens

Year of Fabrication

2007

Instrument specification

Specifications

Electron energy loss spectrometer, EDX detector, HAADF detector, Tomography holder, heating(RT-1000°C)/cooling(lN2-70°C) holder, electron biprism

Usage regulation

Contact

Contact person

Thorsten Mehrtens
Fachbereich 1
NW1, M4190
Phone 0421/218/62273
mehrtens@ifp.uni-bremen.de
http://www.ifp.uni-bremen.de/electron-microscopy/

Marco Schowalter
Fachbereich 1
NW1, M4180
Phone 0421/218/62263
schowalter@ifp.uni-bremen.de
http://www.ifp.uni-bremen.de/electron-microscopy/

Principal Investigator

Rosenauer, Andreas

Updated by: MAPEX