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MAPEX Instrument Database

FastScanning AFM

General information

Description
Atomic Force Microscope
Manufacturer
Bruker
Location
Fachbereich 5
Mineralogy GEO
Category
Microscopy, Surface Analytics
MAPEX Category
Surface / Interface Characterization, Material Properties
Keywords
surface topography, surface chemistry, surface reaction kinetics, surface films, roughness
Measured Quantity
surface heights, surface forces, mechanical properties
Main Application
Analysis of chemical kinetics during dissolution/ corrosion, growth, and adsorption of materials
Features
High-speed analysis of reacting surfaces
Year of Fabrication
2015

Instrument specification

Specifications

Scan head for fast measurements (100 Hz), FOV =  30 µm x 30 µm, low noise level < 200 pm RMS, second scan head for large FOVs up to 80 µm x 80 µm, measurements in fluid cells, fluid temperature up to 60°C, measurement modes include contact, tapping, phase imaging, force spectroscopy, electrochemical potential.

Contact

Contact person

Andreas Lüttge
Fachbereich 5
GEO
Phone 0421-218-65233
andrluet@uni-bremen.de
www.marum.de/Andreas_Luettge.html

Cornelius Fischer
Fachbereich 5
GEO
Phone 0421-218-65222
cornelius.fischer@uni-bremen.de
www.marum.de/Cornelius_Fischer.html

Principal Investigator
Lüttge, Andreas
Updated by: MAPEX