MAPEX Instrument Database
FastScanning AFM
General information
Description
Atomic Force Microscope
Manufacturer
Bruker
Location
Fachbereich 5
Mineralogy GEO
Mineralogy GEO
Category
Microscopy, Surface Analytics
MAPEX Category
Surface / Interface Characterization, Material Properties
Keywords
surface topography, surface chemistry, surface reaction kinetics, surface films, roughness
Measured Quantity
surface heights, surface forces, mechanical properties
Main Application
Analysis of chemical kinetics during dissolution/ corrosion, growth, and adsorption of materials
Features
High-speed analysis of reacting surfaces
Year of Fabrication
2015
Instrument specification
Specifications
Scan head for fast measurements (100 Hz), FOV = 30 µm x 30 µm, low noise level < 200 pm RMS, second scan head for large FOVs up to 80 µm x 80 µm, measurements in fluid cells, fluid temperature up to 60°C, measurement modes include contact, tapping, phase imaging, force spectroscopy, electrochemical potential.
Contact
Contact person
Andreas Lüttge
Fachbereich 5
GEO
Phone 0421-218-65233
andrluet@uni-bremen.de
www.marum.de/Andreas_Luettge.html
Cornelius Fischer
Fachbereich 5
GEO
Phone 0421-218-65222
cornelius.fischer@uni-bremen.de
www.marum.de/Cornelius_Fischer.html
Principal Investigator
Lüttge, Andreas