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MAPEX Instrument Database

AFM

General information

Description
Atomic Force Microscopy
Manufacturer
JPK Berlin Germany
Category
Microscopy, Surface Analytics, Spectroscopy
MAPEX Category
Surface / Interface Characterization, Material Properties, Dimensional Properties
Keywords
AFM, surface analysis, nanomaterials, morphology, interaction, force spectroscopy
Measured Quantity
1 sample/ test; at least 5 tests everyday
Main Application
surface analysis, morphology of nanomaterials, interaction between biomolecules and interfaces
Features
high resolution, simple sample preparation, and quick measurement
Year of Fabrication
2012

Instrument specification

Specifications

For solid sample, its surface should be flat with nanoscale roughness. The dimension can be 1cm*1cm or bigger. For the liquid sample like nanoparticles, the sample should be dropped onto a flat substrate like silica wafer or mica, and the sample can be measured after it is dried. For the force spectroscopy measurement, it is necessary to contact with Dr. Wei or Miss. Li before the experiments because there are special needs for the modification of substrates and AFM probes.

Contact

Contact person

Gang Wei
Fachbereich 4
TAB/3.35
Phone 0049-421-21864581
wei@uni-bremen.de

Jingfeng Li
Fachbereich 4
TAB/3.29
Phone 0049-421-21864583
jinfeng@uni-bremen.de

Principal Investigator
Colombi Ciacchi, Lucio
Updated by: MAPEX