Thermische Charakterisierung von Halbleitermaterialien

Joined optical and thermal characterization of a III-nitride semiconductor membrane by micro-photoluminescence spectroscopy and Raman thermometry

M. Elhajhasan, W. Seemann, K. Dudde, D. Vaske, G. Callsen, I. Rousseau, T. F. K. Weatherly, J.-F. Carlin, R. Butté, N. Grandjean, N. H. Protik, and G. Romano

Preprint on arXiv:2306.16980