60 https://www.uni-bremen.de/mapex-cf/instrumentation/3d-materials-analytics/phoenix-x-ray-ct This page contains information about the microtomography scanner v-tome-x of BIAS. de Universität Bremen Fri, 06 Mar 2026 17:51:13 +0100 Fri, 06 Mar 2026 17:51:13 +0100 Universität Bremen content-280269 Wed, 04 Mar 2026 23:43:54 +0100 https://www.uni-bremen.de/mapex-cf/instrumentation/3d-materials-analytics/phoenix-x-ray-ct#c280269 <p><span lang="en" dir="ltr">Our Phoenix-xray v|tome|x m is equipped with two X-ray sources:  (1) a 180 <abbr title="kiloVolt">kV</abbr> / 15 <abbr title="Watt">W</abbr> nano-focus x-ray tube, and (2) a 240 <abbr title="kiloVolt">kV</abbr> / 320 <abbr title="Watt">W</abbr> micro-focus x-ray tube. For (1), the detail detectability goes down to 1 <abbr title="Micrometer">μm</abbr> (object size 2 <abbr title="Millimeter">mm</abbr>), while (2) can penetrate up to 40 <abbr title="Millimeter">mm</abbr> steel, and has a detail detectability down to 3 <abbr title="Micrometer">μm</abbr>. Max. object size is (height x diameter) 600 <abbr title="Millimeter">mm</abbr> x 500 <abbr title="Millimeter">mm</abbr>, max. object weight is 50 <abbr title="Kilogram">kg</abbr>.</span></p> Content content-280270 Wed, 04 Mar 2026 23:43:54 +0100 https://www.uni-bremen.de/mapex-cf/instrumentation/3d-materials-analytics/phoenix-x-ray-ct#c280270 <p><span lang="en" dir="ltr">The method is based on the detection and localisation of the degree of attenuation of the incident X-rays in the sample. The attenuation of X-rays by matter depends on both the chemical elements it consists of as well as the material density. The information about the varied X-ray absorption is encoded as grey values in a stack of black-and-white images. Each image consists of volumetric pixels and contains true volumetric information.</span></p> Content content-280271 Wed, 04 Mar 2026 23:43:54 +0100 https://www.uni-bremen.de/mapex-cf/instrumentation/3d-materials-analytics/phoenix-x-ray-ct#c280271 <p><span lang="en" dir="ltr">X-ray micro tomography can characterize all materials that are transparent for X-rays, <abbr title="for example">e.g.</abbr> metals, ceramics, and any kind of sythetic material. The sample surface does not have to be prepared in advance. In our lab we analyze compound materials, opto-electronic components, metals, and more.</span></p> Content content-280268 Wed, 04 Mar 2026 23:43:54 +0100 https://www.uni-bremen.de/mapex-cf/instrumentation/3d-materials-analytics/phoenix-x-ray-ct#c280268 <p><span lang="en" dir="ltr">In general, samples of any shape can be investigated, however a cylindrical shape is most favorable. Sample size may range from a few millimeters to several centimeters. Most important for a successful scan is a sufficient transmission of the sample for X-rays. It is possible to scan a selected sector of a sample.</span></p> Content content-280275 Wed, 04 Mar 2026 23:43:54 +0100 https://www.uni-bremen.de/mapex-cf/instrumentation/3d-materials-analytics/phoenix-x-ray-ct#c280275 <p><span lang="en" dir="ltr">Relevant for the attainable resolution is the position of the sample in the cone beam geometry between the X-ray point-focus source and the detector, which determines the magnification. In general, small samples (1-2 <abbr title="Millimeter">mm</abbr>) can be characterised with high resolution (<1 - 3 <abbr title="Micrometer">μm</abbr> per voxel), and larger samples with lower (20-40 <abbr title="Micrometer">μm</abbr> per voxel).</span></p> Content content-280274 Wed, 04 Mar 2026 23:43:54 +0100 https://www.uni-bremen.de/mapex-cf/instrumentation/3d-materials-analytics/phoenix-x-ray-ct#c280274 <p><span lang="en" dir="ltr">The result is the reconstructed density distribution within the object in the form of a digital image stack or as image volume, which can be downloaded from the lab server. A storage medium will not be provided. In addition, the transmission images can be supplied. An analysis of the tomography data is possible in the context of a scientific cooperation.</span></p> Content content-280273 Wed, 04 Mar 2026 23:43:54 +0100 https://www.uni-bremen.de/mapex-cf/instrumentation/3d-materials-analytics/phoenix-x-ray-ct#c280273 <p><span lang="en" dir="ltr"><strong>Contact person for technical information</strong><br /> Christian Kapitza</span></p> <p><span lang="en" dir="ltr"><strong>Analytical service</strong><br /> Requests for analyse services are welcome for both academic and non-commercial customers. Please contact<br /> <abbr title="Professor">Prof.</abbr>res Ralf B. Bergmann, David May, or</span></p> <p><span lang="en" dir="ltr">Christian Kapitza (e-mail: kapitza@bias.de), </span></p> <p><span lang="en" dir="ltr">Oliver Focke (e-mail: focke@faserinstitut.de).</span></p> <p><span lang="en" dir="ltr"><em>For usage regulations follow the link:</em></span></p> Content