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Infrastructure

New

    The database facilitates scientific work by offering a searchable list of analytical equipment available in the group of MAPEX members. The online database is aimed at making it easier for students, university employees as well as external researchers to learn about analytical methods and get in contact with the responsible Instrument operators. You can easliy browse through the predefined categories or perform keyword and text searches.

    Last added instruments

    Contact and registration of instruments

    Dr. Hanna Lührs

    Phone: +49 (0)421-218-64580
    E-Mail: MAPEX
     

    registration form (Excel)

    Service Electron Microscopy



    Principal Investigator

     Andreas Rosenauer

    Instrument Manufacturer Category Contact
    (S)TEM FEI
    • Diffraction
    • Microscopy
    • Spectroscopy
    • Electron Microscopy
    • Dimensional Properties
    • Surface / Interface Characterization
    • Material Properties
    • Thorsten Mehrtens
    • Marco Schowalter
    3D Laser Lithography Nanoscribe
    • ---
    • Material Properties
    • Surface / Interface Characterization
    • Dimensional Properties
    • Claas Falldorf
    3D Profilometer Sensofar-Tech, S.L.
    • Microscopy
    • Dimensional Properties
    • Jürgen Horvath
    Acoustic Emission Vallen Systeme GmbH
    • Damage analysis
    • Material Properties
    • Renato Almeida
    AFM JPK Berlin Germany
    • Microscopy
    • Surface Analytics
    • Spectroscopy
    • Surface / Interface Characterization
    • Material Properties
    • Dimensional Properties
    • Gang Wei
    • Jingfeng Li
    Axioplan Zeiss
    • ---
    • Surface / Interface Characterization
    • Johanne Hesselbach
    • Manuel Hahn
    Axioskop Zeiss
    • ---
    • Surface / Interface Characterization
    • Johanne Hesselbach
    • Manuel Hahn
    BET MicrotracBEL Corp.
    • Surface Analytics
    • Surface / Interface Characterization
    • Prabu Moni
    BSM Malvern
    • Diffraction
    • Dimensional Properties
    • Daniel Schwenck
    • Nevaf Ciftci
    CD spectrometer Applied Photophysics
    • Spectroscopy
    • Surface / Interface Characterization
    • Monika Michaelis
    Confocal microscope Keyence
    • Microscopy
    • Surface Analytics
    • Dimensional Properties
    • Material Properties
    • Surface / Interface Characterization
    • Claas Falldorf
    • Reiner Klattenhoff
    Creep testing machine Zwick
    • Mechanical testing
    • Material Properties
    • Jürgen Horvath
    • Renato Almeida
    DMA TA Instruments
    • ---
    • Material Properties
    • Dimensional Properties
    • Johanne Hesselbach
    • Manuel Hahn
    DSC TA Instruments
    • ---
    • Material Properties
    • Johanne Hesselbach
    • Manuel Hahn
    E-beam lithography Raith
    • ---
    • Material Properties
    • Dimensional Properties
    • Surface / Interface Characterization
    • Reiner Klattenhoff
    EMPA JEOL
    • Microscopy
    • Surface Analytics
    • Spectroscopy
    • Surface / Interface Characterization
    • Near- / Subsurface Properties
    • Herbert Juling
    FastScanning AFM Bruker
    • Microscopy
    • Surface Analytics
    • Surface / Interface Characterization
    • Material Properties
    • Andreas Lüttge
    • Cornelius Fischer
    Fatigue testing machine Roell Amsler
    • Mechanical testing
    • Material Properties
    • Renato Almeida
    • Jürgen Horvath
    FIB Zeiss
    • Electron Microscopy
    • Surface / Interface Characterization
    • Near- / Subsurface Properties
    • Dimensional Properties
    • Reiner Klattenhoff
    FT-Raman Bruker
    • Spectroscopy
    • Material Properties
    • Near- / Subsurface Properties
    • Dimensional Properties
    • Mangir M. Murshed
    FTIR Bruker
    • Spectroscopy
    • Material Properties
    • Mangir M. Murshed
    G3 Malvern
    • Microscopy
    • Dimensional Properties
    • Nils Ellendt
    • Daniel Schwenck
    Gleeble 3500 Dynamic Systems
    • ---
    • Material Properties
    • Andree Irretier
    • Münip Dalgic
    He pygnometer Porotec
    • ---
    • Material Properties
    • Tina Kühn
    Hg porosimeter POROTEC GmbH
    • ---
    • Material Properties
    • Tina Kühn
    Inspekt 100 Hegewald & Peschke
    • Surface Analytics
    • Material Properties
    • Michael Brink
    IPDS Stoe & Cie
    • Diffraction
    • Material Properties
    • Lars Robben
    Laser Flash Unit NETZSCH-Gerätebau GmbH
    • Characterization
    • Material Properties
    • Christian Ellenberg
    LEEM Elmitec
    • Diffraction
    • Microscopy
    • Electron Microscopy
    • Surface / Interface Characterization
    • Dr. Jon-Olaf Krisponeit
    • Jens Falta
    LFA 457 Netzsch
    • ---
    • Material Properties
    • Johanne Hesselbach
    • Manuel Hahn
    M420 Wild
    • ---
    • Surface / Interface Characterization
    • Johanne Hesselbach
    • Manuel Hahn
    NDT GrindoSonic
    • Mechanical testing
    • Material Properties
    • Jürgen Horvath
    • Renato Almeida
    Raman Horiba Jobin Yvon
    • Spectroscopy
    • Material Properties
    • Near- / Subsurface Properties
    • Dimensional Properties
    • Mangir M. Murshed
    Rheometer TA Instruments
    • ---
    • Material Properties
    • Dimensional Properties
    • Johanne Hesselbach
    • Manuel Hahn
    Rheometer DHR-3 TA Instruments
    • ---
    • Material Properties
    • Surface / Interface Characterization
    • Michael Maas
    • Joeri Smits
    Rheometer Kinexus Malvern
    • ---
    • Material Properties
    • Michael Maas
    • Jéssica Condi Mainardi
    SEM Jeol
    • Microscopy
    • Material Properties
    • Surface / Interface Characterization
    • Near- / Subsurface Properties
    • Lars Robben
    SEM Zeiss
    • Surface Analytics
    • Surface / Interface Characterization
    • Dimensional Properties
    • Eva-Maria Meyer
    • Daniel Gräbner
    Spectrometry Lab
    • Characterization
    • Surface / Interface Characterization
    • Jérémy Epp
    STA Netzsch
    • ---
    • Material Properties
    • Michael Wendschuh
    STA Bähr-Thermoanalyse GmbH
    • ---
    • Material Properties
    • Daniel Schumacher
    • Tina Kühn
    Stadimp Stoe & Cie GmbH Darmstadt
    • Diffraction
    • Structure characterization
    • non-ambient X-ray powder diffraction
    • in-situ reaction studies
    • Material Properties
    • Dr. Lars Robben
    StadiP Stoe & Cie
    • Diffraction
    • Material Properties
    • Lars Robben
    STM/XPS/LEED Omicron
    • Microscopy
    • Characterization
    • Diffraction
    • Surface / Interface Characterization
    • Near- / Subsurface Properties
    • Dimensional Properties
    • Jens Falta
    • Jon-Olaf Krisponeit
    SurPASS Anton Paar
    • Surface Analytics
    • Material Properties
    • Surface / Interface Characterization
    • Marieke Hoog Antink
    • Joeri Smits
    TGA Eltra
    • ---
    • Material Properties
    • Johanne Hesselbach
    • Manuel Hahn
    TMA TA Instruments
    • ---
    • Material Properties
    • Dimensional Properties
    • Johanne Hesselbach
    • Manuel Hahn
    VSI-R Bruker/Renishaw
    • Surface Analytics
    • Spectroscopy
    • Microscopy
    • Surface / Interface Characterization
    • Material Properties
    • Andreas Lüttge
    • Cornelius Fischer
    X-ray CT GE
    • ---
    • Material Properties
    • Dimensional Properties
    • Surface / Interface Characterization
    • Christian Kapitza
    X-Ray Lab
    • Diffraction
    • Near- / Subsurface Properties
    • Material Properties
    • Jérémy Epp
    X-Ray Powder Stoe & Cie GmbH, Darmstadt
    • Diffraction
    • Structure characterization
    • non-ambient X-ray powder diffraction
    • in-situ reaction studies
    • Surface / Interface Characterization
    • Material Properties
    • Lars Robben
    XRD powder Panalytical
    • Diffraction
    • Near- / Subsurface Properties
    • Material Properties
    • Michael Wendschuh
    • Johannes Birkenstock
    XRD powder Bruker
    • Diffraction
    • Near- / Subsurface Properties
    • Material Properties
    • Michael Wendschuh
    • Johannes Birkenstock
    XRD powder GE Sensing & Inspection Technologies GmbH
    • Diffraction
    • Near- / Subsurface Properties
    • Material Properties
    • Marieke M. Hoog Antink
    • Christian Ellenberg
    XRD single crystal Bruker
    • Diffraction
    • Near- / Subsurface Properties
    • Material Properties
    • Johannes Birkenstock
    • Michael Wendschuh
    XRD single crystal Bruker
    • Diffraction
    • Near- / Subsurface Properties
    • Material Properties
    • Enno Lork
    XRM ZEISS
    • Microscopy
    • Material Properties
    • Dimensional Properties
    • Surface / Interface Characterization
    • Oliver Focke
    Z 250 Zwick
    • ---
    • Material Properties
    • Johanne Hesselbach
    • Manuel Hahn
    Z005 Zwick
    • Mechanical testing
    • Material Properties
    • Renato Almeida
    • Jürgen Horvath
    Zetasizer Malvern
    • Surface Analytics
    • Dimensional Properties
    • Surface / Interface Characterization
    • Michael Maas
    • Joeri Smits
    Aktualisiert von: MAPEX