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MAPEX Instrument Database

IPDS

General information

Description
Imaging Plate Detection System
Manufacturer
Stoe & Cie
Location
Fachbereich 2
IACK
Chemische Kristallographie fester Stoffe NW2 C3240
Category
Diffraction
MAPEX Category
Material Properties
Keywords
single crystal diffraction, XRD
Measured Quantity
h,k,l,I
Main Application
Single Crystal structure solution / refinement
Features
high temperature measurements possible

Instrument specification

Specifications

293K-1073K; minimum crystal size approx. 20µm

Contact

Contact person

Lars Robben
Fachbereich 2 / IACK
NW2/C3051
Phone 63142
lrobben@uni-bremen.de

Principal Investigator
Gesing, Thorsten
Fischer, Reinhard X.
Aktualisiert von: MAPEX