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MAPEX Instrument Database

Spectrometry Lab

General information

Category
Characterization
MAPEX Category
Surface / Interface Characterization
Keywords
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Instrument specification

Specifications
  • Optical Emission Spectroscopy (Spark-spectrometer) for bulk-analyses of single elements or full analysis; element depth profile with mechanical layer removal; element mappings in x,-y plane. Required sample characteristics: flat surface, electroconductive, Sample geometry: min. 15x15x1mm; max. 70x70x50mm.
  • Glow Discharge Optical Emission Spectrometer for element depth profile with very high depth resolution. Suitable for the analysis of surface layers up to 100 µm. Required sample characteristics: flat surface, electroconductive, Sample geometry: min. 15x15x1mm; max. 70x70x30mm.

Contact

Contact person

Jérémy Epp
IWT
Phone 0421 218-51335
epp@iwt-bremen.de
www.iwt-bremen.de

Principal Investigator
Zoch, Hans-Werner
Aktualisiert von: MAPEX