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MAPEX Instrument Database

LEEM

General information

Description
Low-energy electron microscope
Manufacturer
Elmitec
Location
Fachbereich 1
IFP
AG Falta NW 1 M0040
Category
Diffraction, Microscopy, Electron Microscopy
MAPEX Category
Surface / Interface Characterization
Keywords
surface microscopy, surface diffraction, surface dynamics
Measured Quantity
surface morphology, surface structure
Main Application
in situ structural characterization of near-surface transformation processes in real-time
Features
in situ sample preparation by molecular beam epitaxy
Year of Fabrication
2010

Instrument specification

Specifications

Low-energy electron microscopy is a full-field diffractive imaging technique that allows imaging the morphology and surface structure of a crystalline sample at a lateral resolution down to about 10 nm for fields of view in the range of 3 to 50 microns at video rates (~10 Hz). Vertical resolution is limited to imaging of atomic surface steps. Preferred sample characteristics: flat, mono- or polycrystalline specimens up to 9x9 mm2, thickness up to 2 mm

Newsletter supplement:
04: LEEM - LOW ENERGY ELECTRON MICROSCOPY

Contact

Contact person

Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Phone 62248
krisponeit@ifp.uni-bremen.de
ifp.uni-bremen.de

Jens Falta
Fachbereich 1
NW1, W4190
Phone 62244
falta@ifp.uni-bremen.de
ifp.uni-bremen.de

Principal Investigator
Falta, Jens
Aktualisiert von: MAPEX