MAPEX Instrument Database
XRD single crystal
Fast 4-circle Kappa-diffractometer with monochromatic Mo K_alppha radiation and 2D detector.
Typically complete difraction data sets may be obtained for crystal structure analysis of single crystals of about 100-400 µm diameter.
Determination of orientation only is also possible for large crystals up to several mm. Extremely small amounts of powder may be subjected to rotation measurements to achieve powder patterns (however, with rather low resolution in reflection widths) - usually use powder XRD for small samples due to better resolution.
Typical single crystals may be subjected to non-ambient temperature (not routine, no calibration yet, Sept. 2015) from -100 to 1000°C.
01: Single Crystal X-ray Diffractometer