Zum Hauptinhalt springen

Infrastructure

The database facilitates scientific work by offering a searchable list of analytical equipment available in the group of MAPEX members. The online database is aimed at making it easier for students, university employees as well as external researchers to learn about analytical methods and get in contact with the responsible Instrument operators. You can easliy browse through the predefined categories or perform keyword and text searches.

Last added instruments

Contact and registration of instruments

Dr. Guilherme Dalla Lana Semione

Phone: +49 421 218 64573
E-Mail: semioneprotect me ?!uni-bremenprotect me ?!.de

 

registration form (Excel)

Service Electron Microscopy

Principal Investigator

 Andreas Rosenauer

A click on the logo will lead you to the MAPEX-CF website.
InstrumentManufacturerCategoryContact
(S)TEMFEI
  • Diffraction
  • Microscopy
  • Spectroscopy
  • Electron Microscopy
  • Dimensional Properties
  • Surface / Interface Characterization
  • Material Properties
  • Thorsten Mehrtens
  • Marco Schowalter
3D Laser LithographyNanoscribe
  • ---
  • Material Properties
  • Surface / Interface Characterization
  • Dimensional Properties
  • Claas Falldorf
3D ProfilometerSensofar-Tech, S.L.
  • Microscopy
  • Dimensional Properties
  • Jürgen Horvath
Acoustic EmissionVallen Systeme GmbH
  • Damage analysis
  • Material Properties
  • Renato Almeida
AFMJPK Berlin Germany
  • Microscopy
  • Surface Analytics
  • Spectroscopy
  • Surface / Interface Characterization
  • Material Properties
  • Dimensional Properties
  • Gang Wei
  • Jingfeng Li
AxioplanZeiss
  • ---
  • Surface / Interface Characterization
  • Johanne Hesselbach
  • Manuel Hahn
AxioskopZeiss
  • ---
  • Surface / Interface Characterization
  • Johanne Hesselbach
  • Manuel Hahn
BETMicrotracBEL Corp.
  • Surface Analytics
  • Surface / Interface Characterization
  • Prabu Moni
BSMMalvern
  • Diffraction
  • Dimensional Properties
  • Daniel Schwenck
  • Nevaf Ciftci
CD spectrometerApplied Photophysics
  • Spectroscopy
  • Surface / Interface Characterization
  • Isabell Grothaus
Confocal microscopeKeyence
  • Microscopy
  • Surface Analytics
  • Dimensional Properties
  • Material Properties
  • Surface / Interface Characterization
  • Claas Falldorf
  • Reiner Klattenhoff
Creep testing machineZwick
  • Mechanical testing
  • Material Properties
  • Jürgen Horvath
  • Renato Almeida
CT-ALPHAProCon X-Ray GmbH
  • 3D Materials Analytics
  • Material Properties
  • Dimensional Properties
  • Wolf-Achim Kahl
DMATA Instruments
  • ---
  • Material Properties
  • Dimensional Properties
  • Johanne Hesselbach
  • Manuel Hahn
DSCTA Instruments
  • ---
  • Material Properties
  • Johanne Hesselbach
  • Manuel Hahn
E-beam lithographyRaith
  • ---
  • Material Properties
  • Dimensional Properties
  • Surface / Interface Characterization
  • Reiner Klattenhoff
EMPAJEOL
  • Microscopy
  • Surface Analytics
  • Spectroscopy
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Andree Irretier
FastScanning AFMBruker
  • Microscopy
  • Surface Analytics
  • Surface / Interface Characterization
  • Material Properties
  • Andreas Lüttge
  • Cornelius Fischer
Fatigue testing machineRoell Amsler
  • Mechanical testing
  • Material Properties
  • Renato Almeida
  • Jürgen Horvath
FIBZeiss
  • Electron Microscopy
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Reiner Klattenhoff
FT-RamanBruker
  • Spectroscopy
  • Material Properties
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Mangir M. Murshed
FTIRBruker
  • Spectroscopy
  • Material Properties
  • Mangir M. Murshed
G3Malvern
  • Microscopy
  • Dimensional Properties
  • Nils Ellendt
  • Daniel Schwenck
Gleeble 3500Dynamic Systems
  • ---
  • Material Properties
  • Andree Irretier
  • Münip Dalgic
He pygnometerPorotec
  • ---
  • Material Properties
  • Tina Kühn
Hg porosimeterPOROTEC GmbH
  • ---
  • Material Properties
  • Tina Kühn
Inspekt 100Hegewald & Peschke
  • Surface Analytics
  • Material Properties
  • Michael Brink
  • Michael Vogel
IPDSStoe & Cie
  • Diffraction
  • Material Properties
  • Lars Robben
Laser Flash UnitNETZSCH-Gerätebau GmbH
  • Characterization
  • Material Properties
  • Christian Ellenberg
LEEMElmitec
  • Diffraction
  • Microscopy
  • Electron Microscopy
  • Surface / Interface Characterization
  • Jon-Olaf Krisponeit
  • Jens Falta
LFA 457Netzsch
  • ---
  • Material Properties
  • Johanne Hesselbach
  • Manuel Hahn
M420Wild
  • ---
  • Surface / Interface Characterization
  • Johanne Hesselbach
  • Manuel Hahn
NDTGrindoSonic
  • Mechanical testing
  • Material Properties
  • Jürgen Horvath
  • Renato Almeida
RamanHoriba Jobin Yvon
  • Spectroscopy
  • Material Properties
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Mangir M. Murshed
RheometerTA Instruments
  • ---
  • Material Properties
  • Dimensional Properties
  • Johanne Hesselbach
  • Manuel Hahn
Rheometer DHR-3TA Instruments
  • ---
  • Material Properties
  • Surface / Interface Characterization
  • Michael Maas
  • Joeri Smits
Rheometer KinexusMalvern
  • ---
  • Material Properties
  • Michael Maas
  • Jéssica Condi Mainardi
SEMZeiss
  • Surface Analytics
  • Surface / Interface Characterization
  • Dimensional Properties
  • Eva-Maria Meyer
  • Daniel Gräbner
SEMJeol
  • Electron Microscopy
  • Material Properties
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Lars Robben
Spectra 300ThermoFisher Scientific
  • Electron Microscopy
  • Dimensional Properties
  • Material Properties
  • Surface / Interface Characterization
  • Thorsten Mehrtens
  • Marco Schowalter
Spectrometry Lab
  • Characterization
  • Surface / Interface Characterization
  • Jérémy Epp
STABähr-Thermoanalyse GmbH
  • ---
  • Material Properties
  • Daniel Schumacher
  • Tina Kühn
STANetzsch
  • ---
  • Material Properties
  • Michael Wendschuh
StadiPStoe & Cie
  • Diffraction
  • Material Properties
  • Lars Robben
STM/XPS/LEEDOmicron
  • Microscopy
  • Characterization
  • Diffraction
  • Spectroscopy
  • Surface / Interface Characterization
  • Near- / Subsurface Properties
  • Dimensional Properties
  • Jens Falta
  • Jon-Olaf Krisponeit
SurPASSAnton Paar
  • Surface Analytics
  • Material Properties
  • Surface / Interface Characterization
  • Marieke Hoog Antink
  • Joeri Smits
TGAEltra
  • ---
  • Material Properties
  • Johanne Hesselbach
  • Manuel Hahn
TMATA Instruments
  • ---
  • Material Properties
  • Dimensional Properties
  • Johanne Hesselbach
  • Manuel Hahn
VSI-RBruker/Renishaw
  • Surface Analytics
  • Spectroscopy
  • Microscopy
  • Material Properties
  • Andreas Lüttge
  • Cornelius Fischer
X-ray CTGE
  • ---
  • Material Properties
  • Dimensional Properties
  • Surface / Interface Characterization
  • Christian Kapitza
X-Ray Lab
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Jérémy Epp
X-Ray PowderStoe & Cie GmbH
  • Diffraction
  • Structure characterization
  • non-ambient X-ray powder diffraction
  • in-situ reaction studies
  • Surface / Interface Characterization
  • Material Properties
  • Lars Robben
XRD powderGE Sensing & Inspection Technologies GmbH
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Marieke M. Hoog Antink
  • Christian Ellenberg
XRD powderBruker
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Michael Wendschuh
  • Johannes Birkenstock
XRD powderPanalytical
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Michael Wendschuh
  • Johannes Birkenstock
XRD single crystalBruker
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Enno Lork
XRD single crystalBruker
  • Diffraction
  • Near- / Subsurface Properties
  • Material Properties
  • Johannes Birkenstock
  • Michael Wendschuh
XRMZEISS
  • 3D X-ray microscopy
  • Material Properties
  • Dimensional Properties
  • Surface / Interface Characterization
  • Wolf-Achim Kahl
Z 250Zwick
  • ---
  • Material Properties
  • Johanne Hesselbach
  • Manuel Hahn
Z005Zwick
  • Mechanical testing
  • Material Properties
  • Renato Almeida
  • Jürgen Horvath
ZetasizerMalvern
  • Surface Analytics
  • Dimensional Properties
  • Surface / Interface Characterization
  • Michael Maas
  • Joeri Smits
Aktualisiert von: MAPEX