Universität Bremen - Maike Taddiken

60 Universität Bremen - Maike Taddiken https://www.uni-bremen.de/me/team/ehemalige-teammitglieder/maike-taddiken Master Courses, Master Abschluss, M. Sc., Abschlüsse beim ITEM de Universität Bremen Sat, 07 Mar 2026 06:53:50 +0100 Sat, 07 Mar 2026 06:53:50 +0100 Universität Bremen content-234224 Wed, 19 Oct 2022 12:38:49 +0200 M. Sc. Maike Taddiken https://www.uni-bremen.de/me/team/ehemalige-teammitglieder/maike-taddiken#c234224 Contact: <a class="mail" href="mailto:taddiken@me.uni-bremen.de" title="Öffnet ein Fenster zum Versenden der E-Mail">taddiken(at)me.uni-bremen.de</a> Phone: +49-421-218 62551 Office: NW1 W 2100 Research: <ul> <li>Behavioral Modeling of analog/Mixed-Signal Systems for Reliability</li> <li>Reliability assessment on system level</li> </ul> Teaching: <ul> <li>WiSe: Skriptsprachen für Ingenieure</li> <li>SoSe: Microelectronics Lab</li> </ul> Publications: <ul> <li>Taddiken, M., Paul, S., Peters-Drolshagen, D. (2021). Monitoring Analog Circuit Performance using Adaptive Filters and RSM-based Behavioral Models. International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) &nbsp;</li> <li>Taddiken, M., Hillebrand, T., Peters-Drolshagen, D., &amp; Paul, S. (2021). Stochastic behavioral models for system level reliability analysis including non-normal and correlated process variation. Microelectronics Reliability, 118, 114044. &nbsp;</li> <li>Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen "Charge-Based Model for Reliability Analysis Flow of Flip-Flops under Process Variation and Aging" SMACD 2019, Lausanne, Switzerland &nbsp;</li> <li>Maike Taddiken, Theodor Hillebrand, Steffen Paul and Dagmar Peters-Drolshagen: "ReSeMBleD- Methods for Response Surface Model Behavioral Description", 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2018, Prague, Czech Republic, July 2018 - 3rd Place EDA Competition &nbsp;</li> <li>Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul and Dagmar Peters-Drolshagen: " Design for reliability of generic sensor interface circuits", Microelectronics Reliability, 80, 184-197, 2018 &nbsp;</li> <li>Maike Taddiken, Theodor Hillebrand, Steffen Paul and Dagmar Peters-Drolshagen: "Chasing tails: Reliability-Aware Feasibility Analysis for Analog System Design", 55th Design Automation Conference (DAC), 2018, San Francisco, USA, June 2018 - Work in Progress (WIP) Poster, not in proceedings &nbsp;</li> <li>Maike Taddiken, Theodor Hillebrand, Steffen Paul and Dagmar Peters-Drolshagen: "LUT-based Stochastic Modeling for Non-Normal Performance Distributions", 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2018, Prague, Czech Republic, July 2018</li> </ul> <ul> <li>Maike Taddiken, Theodor Hillebrand, Steffen Paul and Dagmar Peters-Drolshagen: "Variation-and degradation-aware stochastic behavioral modeling of analog circuit components", 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2017, Giardini-Naxos, Italy, June 2017</li> </ul> <ul> <li>Sascha Heinssen, Maike Taddiken, Theodor Hillebrand, Steffen Paul and Dagmar Peters-Drolshagen: " Behavioral modeling of a sensor interface circuit including various non-idealities", 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2017, Giardini-Naxos, Italy, June 2017</li> </ul> <ul> <li>Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen and Steffen Paul: " Analysis of aging effects-From transistor to system level", &nbsp;Microelectronics Reliability, 67, 64-73, 2016</li> </ul> <ul> <li>Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul and Dagmar Peters-Drolshagen: "Vth is dead-long live the threshold voltage", In Integrated Reliability Workshop (IIRW), 2016</li> </ul> <ul> <li>Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul and Dagmar Peters-Drolshagen: " Unified stochastic reliability aware model for SONOS memories in Harsh environments", &nbsp;16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Bremen, Germany, 2016</li> </ul> <ul> <li>Maike Taddiken, Theodor Hillebrand, Konstantin Tscherkaschin, Steffen Paul and Dagmar Peters-Drolshagen: " Parameter identification for behavioral modeling of analog components including degradation", Mixed Design of Integrated Circuits and Systems, 2016 MIXDES-23rd International Conference, Lodz, Poland, June 2016</li> </ul> Content