2016 - 2019
estimation during power cycling of SiC-MOSFETs, IET Power Electronics 18 (15), 3903-3909 N. Kaminski, S. Rugen, F. Hoffmann, (invited), Gaining Confidence – A Review of Silicon Carbide‘s Reliability Status , [...] International Conference on Silicon Carbide and Related Materials, ICSCRM 2019, Kyoto, Japan, 2019. Sarah Rugen, Siddarth Sundaresan, Ranbir Singh and Nando Kaminski, Investigation of Bipolar Degradation of 1.2 [...] Diodes , in International Symposium on Advanced Power Packaging, ISAPP 2019, Osaka, Japan, 2019. Sarah Rugen, Hauke Lutzen and Nando Kaminski, Characterization of the Gate Oxide of planar and trench SiC-MOSFETs