Publikationen
of Si(113) C. Klein, I. Heidmann, T. Nabbefeld, M. Speckmann, Th. Schmidt, Frank-J. Meyer zu Heringsdorf, J. Falta, and M. Horn-von Hoegen Surface Science, 618, (2013) 109-114 Spatial correlation of ph [...] Heringdorf, M. Kammler, M. Horn-von Hoegen and M. Copel, Appl. Surf. Sci. 123/124 (1998) 538 X-ray characterization of buried d layers J. Falta, D. Bahr, G. Materlik, B.H. Müller and M. Horn-von Hoegen, Surf. Rev [...] B.H. Müller and M. Horn-von Hoegen, Appl. Phys. Lett. 68 (1996) 1394 X-ray interface characterization of Ge d layers on Si(001) D. Bahr, J. Falta, G. Materlik, B.H. Müller and M. Horn-von Hoegen, Physica