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Electron Microscopy Highlights

Electron Microscopy|

Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN

 Tim Grieb, Florian F.Krause, Knut Müller-Caspary, Jan Philipp Ahl, Marco Schowalter, Oliver Oppermann, Joachim Hertkorn, Karl Engl, Andreas Rosenauer

Ultramicroscopy (2022) 238, 113503


In this paper we perform angular resolved annular-dark field…

Electron Microscopy|

Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential

Christoph Mahr, Tim Grieb, Florian F.Krause, Marco Schowalter, Andreas Rosenauer

Ultramicroscopy (2022) 236, 113503


The measurement of electric fields in scanning transmission electron microscopy (STEM) is a highly investigated field of research. The…

Image nanoparticle
Electron Microscopy|

Promoting Effect of the Residual Silver on the Electrocatalytic Oxidation of Methanol and Its Intermediates on Nanoporous Gold

Alex Ricardo Silva Olaya, Franziska Kühling, Christoph Mahr, Birthe Zandersons, Andreas Rosenauer, Jörg Weissmüller, and Gunther Wittstock

ACS Catal. 2022, 12, 8, 4415–4429


Nanoporous gold (NPG) obtained by dealloying Ag75Au25 with an overall residual Ag…

Electron Microscopy
Electron Microscopy|

Quantitative 3D Characterization of Nanoporous Gold Nanoparticles by Transmission Electron Microscopy

Christoph Mahr, Alexandra Dworzak, Marco Schowalter, Mehtap Oezaslan and Andreas Rosenauer

Microscopy and Microanalysis (2021) 27, 678 - 686


Quantitative structural characterization of nanomaterials is important to tailor their functional properties.…

Electron Microscopy|

Precise measurement of the electron beam current in a TEM

Florian F. Krause, Marco Schowalter, Oliver Oppermann, Dennis Marquardt, Knut Müller-Caspary, Robert Ritz, Martin Simson, Henning Ryll, Martin Huth, Heike Soltau, Andreas Rosenauer

Ultramicroscopy (2021) 223, 113221


Modern quantitative TEM methods…

Electron Microscopy|

Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si

Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Saleh Firoozabadi, Christoph Mahr, Marco Schowalter, Andreas Beyer, Oliver Oppermann, Kerstin Volz, Andreas Rosenauer

Ultramicroscopy (2021) 221, 113175


The angle-resolved electron scattering is…

Electron Microscopy|

Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods

Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, Andreas Rosenauer

Ultramicroscopy (2021) 221, 113196


Strain analysis by nano-beam electron diffraction allows for measurements of strain with nanometre resolution in…

Electron Microscopy Figure
Electron Microscopy|

Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy

Andreas Beyer, Florian F. Krause, Hoel L. Robert, Saleh Firoozabadi, Tim Grieb, Pirmin Kükelhan, Damien Heimes, Marco Schowalter, Knut Müller-Caspary, Andreas Rosenauer, Kerstin Volz

Nature Scientific Reports (2020) 10, 17890


Scanning transmission…

Electron Microscopy|

Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy

Knut Müller-Caspary, Tim Grieb, Jan Müßener, Nicolas Gauquelin, Pascal Hille, Jörg Schörmann, Johan Verbeeck, Sandra Van Aert, Martin Eickhoff, Andreas Rosenauer

Physical Review Letters (2019) 122, 106102


We report the mapping of polarization-induced…

Electron Microscopy|

Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction

Christoph Mahr, Knut Müller-Caspary, Robert Ritz, Martin Simson, Tim Grieb, Marco Schowalter, Florian F. Krause, Anastasia Lackmann, Heike Soltau, Arne Wittstock, Andreas Rosenauer

Ultramicroscopy (2019) 196, 74-82

Images acquired in transmission electron microscopes can be distorted for various…

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Electron Microscopy|

Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation

Tim Grieb, Moritz Tewes, Marco Schowalter, Knut Müller-Caspary, Florian F. Krause, Thorsten Mehrtens, Jean-Michel Hartmann, Andreas Rosenauer

Ultramicroscopy (2018) 184, 29-36


The chemical composition of four Si1-xGex layers grown on silicon was…

Electron Microscopy Figure
Electron Microscopy|

Quantitative determination of residual silver distribution in nanoporous gold and its influence on structure and catalytic performance

Christoph Mahr, Paromita Kundu, Anastasia Lackmann, Daniele Zanaga, Karsten Thiel, Marco Schowalter, Martin Schwan, Sara Bals, Arne Wittstock, Andreas Rosenauer

Journal of Catalysis (2017) 352, 52-58


Large efforts have been made trying to understand the…

Electron Microscopy Figure
Electron Microscopy|

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction

Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Josef Zweck, Peter Schattschneider & Andreas Rosenauer 

Nature Communications (2014) 5, 5653

doi: 10.1038/ncomms6653

By focusing electrons on probes with a diameter of 50 pm,…

Electron Microscopy Figure
Electron Microscopy|

Conventional Transmission Electron Microscopy Imaging beyond the Diffraction Limit and Information Limits

Andreas Rosenauer, Florian F. Krause, Knut Müller, Marco Schowalter, Thorsten Mehrtens

Physical Review Letters (2014) 113, 096101

doi: 10.1103/PhysRevLett.113.096101

There are mainly two complementary imaging modes in transmission electron microscopy (TEM): Conventional TEM (CTEM) and scanning…

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