MAPEX Core Facility for Materials Analytics
We use X-rays to non-destructively inspect the three-dimensional distribution of matter inside the object of investigation.
We investigate our samples using high-energy electron beams to obtain images with resolution down to the atom scale.
We perform in-situ and real-time chemical, electronic and optical characterization of materials under different conditions, e.g. to identify and map different phases.
We support structure investigations of materials from crystalline nanomaterials to macroscopic single crystals at ambient and non-ambient conditions.
Deformed Honeycomb Lattices of InGaAs Nanowires Grown on Silicon-on-Insulator for Photonic Crystal Surface-Emitting Lasers
Growth Mechanism of Single-Domain Monolayer MoS2 Nanosheets on Au(111) Revealed by In Situ Microscopy: Implications for Optoelectronics Applications
MAPEX-CF is part of the MAPEX Center For Materials and Processes of the University of Bremen.
MAPEX-CF is supported by the Deutsche Forschungsgemeinschaft and is listed under the RIsources portal.
Find analytical equipment available in the MAPEX groups using our Instrument Database.