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MAPEX Core Facility for Materials Analytics

More than a tool box:

We work together to push materials analytics beyond the state of the art in five investigation areas, coupling experimental characterization with materials modelling and simulation.

A click on the logo will lead you to the Instrument Database.

3D Materials Analytics

We use X-rays to non-destructively inspect the three-dimensional distribution of matter inside the object of investigation.

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XRM picture

Electron Microscopy

We investigate our samples using high-energy electron beams to obtain images with resolution down to the atom scale.

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Momentum resolved STEM

Surface Analytics

We combine microscopic and spectroscopic techniques to monitor processes at materials surfaces.

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vertical Scanning Imaging and superimposed Raman Shift

Spectroscopy

We perform in-situ and real-time chemical, electronic and optical characterization of materials under different conditions, e.g. to identify and map different phases.

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Spectroscopy picture

X-ray Diffraction

We support structure investigations of materials from crystalline nanomaterials to macroscopic single crystals at ambient and non-ambient conditions.

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X-Ray Diffraction

Materials Modeling

We develop and apply computational methods from quantum mechanics to continuum theories to design and understand new materials and processes.

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Nanoparticles

Research Highlights and News

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Electron Microscopy|

Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN

 Tim Grieb, Florian F.Krause, Knut Müller-Caspary, Jan Philipp Ahl, Marco Schowalter, Oliver Oppermann, Joachim Hertkorn, Karl Engl, Andreas Rosenauer

Ultramicroscopy (2022) 238, 113503

https://doi.org/10.1016/j.ultramic.2022.113535

In this paper we perform angular resolved annular-dark field…


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Electron Microscopy|

Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential

Christoph Mahr, Tim Grieb, Florian F.Krause, Marco Schowalter, Andreas Rosenauer

Ultramicroscopy (2022) 236, 113503

https://doi.org/10.1016/j.ultramic.2022.113503

The measurement of electric fields in scanning transmission electron microscopy (STEM) is a highly investigated field of research. The…


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X-Ray Diffraction|

Revisiting the Growth of Large (Mg,Zr):SrGa12O19 Single Crystals: Core Formation and Its Impact on Structural Homogeneity Revealed by Correlative X-ray Imaging

Christo Guguschev, Carsten Richter, Mario Brützam, Kaspars Dadzis, Christian Hirschle, Thorsten M. Gesing, Michael Schulze, Albert Kwasniewski, Jürgen Schreuer, and Darrell G. Schlom

Crystal Growth and Design (2022), 22, 4, 2557–2568

https://doi.org/10.1021/acs.cgd.2c00030

We demonstrate the…


Instrument manager

Dr. Guilherme Dalla Lana Semione

University of Bremen
IW3, Room 2190
Am Biologischen Garten 2
28359 Bremen
Phone: +49 421 218 64573
E-Mail: Instrument Manager

Science manager

Dr. Hanna Lührs

University of Bremen
IW3-Building, Room 2230
Am Biologischen Garten 2
28359 Bremen
Phone: +49 421 218 64580
E-Mail: MAPEX

Scientific coordinator

Prof. Dr.-Ing. Lucio Colombi Ciacchi

University of Bremen
TAB-Building, Room 3.30
Am Fallturm 1
28359 Bremen
Phone: +49 421 218 64570
E-Mail: Scientific coordinator

MAPEX-CF is part of the MAPEX Center For Materials and Processes of the University of Bremen.

MAPEX-CF is supported by the Deutsche Forschungsgemeinschaft and is listed under the RIsources portal.

Find analytical equipment available in the MAPEX groups using our Instrument Database.

Updated by: MAPEX