Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Christoph Mahr, Beeke Gerken, Marco Schowalter, Bert Freitag, Andreas Rosenauer

Journal of Microscopy 295 (2024): 140-146

https://doi.org/10.1111/jmi.13276

Atomic electric fields in a thin GaN sample are measured with the centre-of-mass approach in 4D-scanning transmission electron microscopy (4D-STEM) using a 12-segmented STEM detector in a Spectra 300 microscope. The electric fields, charge density and potential are compared to simulations and an experimental measurement using a pixelated 4D-STEM detector. The segmented detector benefits from a high recording speed, which enables measurements at low radiation doses. However, there is measurement uncertainty due to the limited number of segments analysed in this study.