Instrument Database


Low-energy electron microscope

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General information

  • Investigation area
  • Techniques
    Low-energy Electron Microscopy
  • Manufacturer
  • Fabrication year
  • Measured quantity
    surface morphology, surface structure
  • Main application
    in situ structural characterization of near-surface transformation processes in real-time
  • In-situ, real-time compatible

Instrument specification

  • Technical aspects

    Low-energy electron microscopy is a full-field diffractive imaging technique that allows imaging the morphology and surface structure of a crystalline sample at a lateral resolution down to about 10 nm for fields of view in the range of 3 to 50 microns at video rates (~10 Hz). Vertical resolution is limited to imaging of atomic surface steps.

    Preferred sample characteristics: flat, mono- or polycrystalline specimens up to 9x9 mm2, thickness up to 2 mm

  • In-situ capabilities
    Temperature range during operation: 300 - 1300 K; Gas dosing from ultra-high vacuum up to 10-4 mbar during operation;


Instrument location

  • Group
    AG Falta
  • Building
  • Room
  • Faculty
    Fachbereich 1
  • Institute University
Updated by: MAPEX