Surface Analytics

FastScanning AFM

Allgemeine Informationen

Untersuchungsgebiete

Surface Analytics
Techniken

Atomic Force Microscopy
Hersteller

Bruker
Herstellungsjahr

2015
Gemessene Größe

Surface heights, Surface forces, Mechanical properties
Hauptanwendung

Analysis of chemical kinetics during dissolution/ corrosion, growth, and adsorption of materials
In-situ, real-time kompatibel

Ja
Korrelierter Arbeitsablauf verfügbar

Ja
Einrichtung

Der Zugang zu diesem Gerät ist über die MAPEX Core Facility for Materials Analytics möglich.

Technische Aspkete

Scan head for fast measurements (100 Hz), FOV = 32 µm x 32 µm

Low noise level < 200 pm RMS

Second scan head for large FOVs up to 80 µm x 80 µm (in theory 80x80 microns. The current state only allows 42x42 microns. Expensive repair would give us the full range back)

Measurement modes include contact, tapping, phase imaging, force spectroscopy, electrochemical potential
In-situ-Möglichkeiten

Measurements in fluid cells with fluid temperature up to 60°C
Korrelierter Arbeitsablauf

If fiducials are used, then the measurements can be correlated under the Raman and VSI as well.
Weitere Untersuchungsmöglichkeiten

PeakForce QNM (quantitative nanomechanical mapping), magnetic force microscopy (MFM)

Aktualisiert von: MAPEX