General information

• Investigation area

  Surface Analytics
• Techniques

  Atomic Force Microscopy
  
• Manufacturer

  Bruker
• Fabrication year

  2015
• Measured quantity

  Surface heights, Surface forces, Mechanical properties
• Main application

  Analysis of chemical kinetics during dissolution/ corrosion, growth, and adsorption of materials
• In-situ, real-time compatible

  Yes

Instrument specification

• Technical aspects

  Scan head for fast measurements (100 Hz), FOV =  30 µm x 30 µm

  Low noise level < 200 pm RMS

  Second scan head for large FOVs up to 80 µm x 80 µm

  Measurement modes include contact, tapping, phase imaging, force spectroscopy, electrochemical potential

• In-situ capabilities

  Measurements in fluid cells with fluid temperature up to 60°C

Contact

• Application scientist

  Andreas Lüttge
  Fachbereich 5
  GEO
  Phone number 0421-218-65233
  aluttgeprotect me ?!marumprotect me ?!.de
• Cornelius Fischer
  
  Helmholtz-Zentrum Dresden-Rossendorf
  Phone number +493512604660
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• Principal investigator

  Andreas Lüttge
  

Instrument location

• Group

  Mineralogy
• Building

  GEO
• Room

  3220
• Faculty

  Fachbereich 5