Instrument Database
Surface Analytics
FastScanning AFM
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General information
- Investigation area
- TechniquesAtomic Force Microscopy
- ManufacturerBruker
- Fabrication year2015
- Measured quantitySurface heights, Surface forces, Mechanical properties
- Main applicationAnalysis of chemical kinetics during dissolution/ corrosion, growth, and adsorption of materials
- In-situ, real-time compatibleYes
Instrument specification
- Technical aspects
Scan head for fast measurements (100 Hz), FOV = 30 µm x 30 µm
Low noise level < 200 pm RMS
Second scan head for large FOVs up to 80 µm x 80 µm
Measurement modes include contact, tapping, phase imaging, force spectroscopy, electrochemical potential
- In-situ capabilitiesMeasurements in fluid cells with fluid temperature up to 60°C
Contact
- Application scientistAndreas Lüttge
Fachbereich 5
GEO
Phone number 0421-218-65233
aluttgeprotect me ?!marumprotect me ?!.de - Cornelius Fischer
Helmholtz-Zentrum Dresden-Rossendorf
Phone number +493512604660
c.fischerprotect me ?!hzdrprotect me ?!.de - Principal investigatorAndreas Lüttge
Instrument location
- GroupMineralogy
- BuildingGEO
- Room3220
- FacultyFachbereich 5