Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
- Instrument
ManufacturerFastScanning AFM
BrukerInvestigation areaTechniqueAtomic Force MicroscopyKey featuresFast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise levelContact - Instrument
ManufacturerJPK Nanowizard III
JPK Berlin GermanyInvestigation areaTechniqueAtomic Force MicroscopyKey featuresSub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode availableContact - Instrument
ManufacturerRc-VSI
Bruker/RenishawInvestigation areaTechniqueRaman spectroscopy coupled with Vertical Scanning InterferometryKey featuresRaman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes availableContact - Instrument
ManufacturerInvestigation areaTechnique3D Laser LithographyKey features3D laser lithography; Direct laser writing; Structure fabrication; Surface modificationContact - Instrument
ManufacturerPLµ2300 Sensofar
Sensofar-Tech, S.L.Investigation areaTechnique3D ProfilometeryKey featuresConfocal conventional and interferometer microscopeContact - Instrument
ManufacturerBELSORP-mini
MicrotracBEL Corp.Investigation areaTechniqueVolumetric Gas AdsorptionKey featuresSpecific surface area; Pore size distribution; N2 and CO2 adsorption; BETContact - Instrument
ManufacturerInvestigation areaTechniqueElectron Microprobe AnalysisKey features5 x-ray spectrometers, one for light elementsContact - Instrument
ManufacturerSurPass streaming potential measurement
Anton PaarInvestigation areaTechniqueZeta potentialKey featuresAnalysis of bulk material, flat surfaces, porous samples, particles or beadsContact - Instrument
ManufacturerTA Instruments DHR-3
TA InstrumentsInvestigation areaTechniqueRheologyKey featuresEquipped with a 2-d couette interfacial shear geometryContact - Instrument
ManufacturerOCA-1
DataphysicsInvestigation areaTechniqueDrop Shape ProfilometryKey featuresContact angle and surface tension measurements; Dilatational viscoelastic properties of interfacesContact - Instrument
ManufacturerDual Beam Helios G4 PFIB
ThermoFisherInvestigation areaTechniqueElectron/Ion beamKey featuresDual beam SEM (electrom, ion), EDX, EBSD, ToF-SIMSContact - Instrument
ManufacturerDimension Icon XR
BrukerInvestigation areaTechniqueAtomic Force MicroscopyKey features-Contact - Instrument
Manufacturer(AR)XPS/UPS/LEED/TPD
SPECSInvestigation areaTechniqueThermal programmed desorption
Photoemission spectroscopy
Low-energy Electron DiffractionKey features-Contact - Instrument
ManufacturerHelios 600
FEI / ThermoFisherInvestigation areaTechniqueScanning Electron MicroscopyKey featuresCryo-FIB, Slice&ViewContact