Instrument Database
Surface Analytics
Dual Beam Helios G4 PFIB
General information
- Investigation area
- TechniquesElectron/Ion beam
- ManufacturerThermoFisher
- Fabrication year2020
- Main applicationImaging of the surface (including SE, BSE) with various additional detectors including STEM. Analysis by EDX, EBSD and ToF-SIMS. Ablation by ion beam incl. slicing and 3D imaging.
- In-situ, real-time compatibleYes
Instrument specification
- In-situ capabilities
Contact
- Application scientist
- Principal investigatorRainer Fechte-Heinen
Instrument location
- RoomLFM0090
- InstituteIWT