Instrument Database
Surface Analytics
Electron Microprobe Analyzer
General information
- Investigation area
- TechniquesElectron Microprobe Analysis
- ManufacturerJEOL
- Fabrication year2007
- Measured quantityWDX-Analysis
- Main applicationMaterial analysis
Instrument specification
- Technical aspects
Five WDX spectrometers, including one for light elements (C, N, O);
Sample area max. 90 x90 mm, polished surface needed;
Quantitative element analysis down to 100 ppm depending on element
Contact
- Application scientist
- Principal investigatorZoch, Hans-Werner
Instrument location
- GroupMetallography
- BuildingFZB
- Room1110
- InstituteIWT