Instrument Database

Surface Analytics

Electron Microprobe Analyzer

MAPEX Instrument Database Logo

General information

  • Investigation area
  • Techniques
    Electron Microprobe Analysis
  • Manufacturer
    JEOL
  • Fabrication year
    2007
  • Measured quantity
    WDX-Analysis
  • Main application
    Material analysis

Instrument specification

  • Technical aspects

    Five WDX spectrometers, including  one for light elements (C, N, O);
    Sample area max. 90 x90 mm, polished surface needed;
    Quantitative element analysis down to 100 ppm depending on element

Contact

Instrument location

  • Group
    Metallography
  • Building
    FZB
  • Room
    1110
  • Institute
    IWT
Updated by: MAPEX