Instrument Database

Surface Analytics

PLµ2300 Sensofar

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General information

  • Investigation area
  • Techniques
    3D Profilometery
  • Manufacturer
    Sensofar-Tech, S.L.
  • Fabrication year
  • Measured quantity
    3D topography; surface roughness
  • Main application
    3D surface metrology, Measurement and characterization of micro-scale features of surfaces

Instrument specification

  • Technical aspects

    Horizontal resolution: 0.3-4.7 µm

    Vertical resolution: confocal 1 nm, interferometer 0.1 nm

    Horizontal measuring range: confocal 1.9x2.5 mm, interferometer 3.8x5.1 mm (objective-dependent)

    Vertical measuring range: confocal 50 mm, interferometer 100 µm.

    Objective: confocal 10x, 20x, 50x, 150x, interferometer 10x, 50x.




  • Additional measurement possibilities
    Capable of measuring surface topography and roughness


Instrument location

  • Group
    Advanced Ceramics
  • Building
  • Room
  • Faculty
    Fachbereich 4
Updated by: MAPEX