Instrument Database

3D Materials Analytics

Xradia 520 Versa

MAPEX Gerätedatenbank Logo

Allgemeine Informationen

Spezifikationen des Geräts

  • Technische Aspkete

    two-stage geometric and optical magnification based on high resolution optics, (0.4X, 4X and 20X objectives) to provide submicron resolution at large working distances, for a large range of sample sizes

    diffraction contrast tomography for unlocking crystallographic information (mapping of grain orientations)

    flexible, high contrast imaging for challenging materials—low atomic number (low Z) materials, soft tissue, polymers, fossilized organisms encased in amber, and other materials of low contrast

    in-situ-stage to characterize the microstructure of materials in native-like environments (under variation of pressure, tensile or temperature) as well as the evolution of properties over time (4D)



  • In-situ-Möglichkeiten
    Mechanical in-situ test stage
  • Korrelierter Arbeitsablauf
    A correlated workflow from XRM to SEM (Auriga 40, IMSAS) in terms of sample positioning / localized analyses is possible via the Atlas software (ZEISS)


  • Anwendungswissenschaftler
    Wolf-Achim Kahl
    MAPEX Center for Materials and Processes
    GEO-Building / Room 5070
    Telefonnummer +49 421 218 65408
    wakahlprotect me ?!uni-bremenprotect me ?!.de
  • Führender Anwendungswissenschaftler
    Lucio Colombi Ciacchi


  • Gebäude
  • Raum
Aktualisiert von: MAPEX