3D Materials Analytics

Xradia 520 Versa

Allgemeine Informationen

Untersuchungsgebiete

3D Materials Analytics
Techniken

3D X-ray Microscopy
Hersteller

ZEISS
Herstellungsjahr

2016
Gemessene Größe

True 3D spatial arrangement of X-ray absorption in the sample
Hauptanwendung

Non-destructive testing, characterization of the 3D microstructure of industrial or geologic materials, biologic tissues etc.
In-situ, real-time kompatibel

Ja
Korrelierter Arbeitsablauf verfügbar

Ja
Einrichtung

Der Zugang zu diesem Gerät ist über die MAPEX Core Facility for Materials Analytics möglich.

Technische Aspkete

Two-stage geometric and optical magnification based on high resolution optics, (0.4X, 4X and 20X objectives) to provide submicron resolution at large working distances, for a large range of sample sizes

Diffraction contrast tomography for unlocking crystallographic information (mapping of grain orientations)

Phase contrast imaging for challenging materials of low atomic number (low Z) materials: soft tissue, polymers, fossilized organisms encased in amber, and other materials of low contrast

In-situ-stage to characterize the microstructure of materials in native-like environments (under variation of pressure, tensile or temperature) as well as the evolution of properties over time (4D).
In-situ-Möglichkeiten

Mechanical in-situ test stage: Deben CT5000TEC
Korrelierter Arbeitsablauf

A correlated workflow for the transfer of mounted samples from XRM to SEM imaging (all SEM on campus) is available. A correlated workflow for the transfer of mounted samples between XRM and NMR is available.

Aktualisiert von: MAPEX