Xradia 520 Versa

General information

Investigation area
3D Materials Analytics
Techniques
3D X-ray Microscopy
Manufacturer
ZEISS
Fabrication year
2016
Measured quantity
True 3D spatial arrangement of X-ray absorption in the sample
Main application
Non-destructive testing, characterization of the 3D microstructure of industrial or geologic materials, biologic tissues etc.
In-situ, real-time compatible
Yes
Correlated workflow available
Yes
Facility
Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Technical aspects
two-stage geometric and optical magnification based on high resolution optics, (0.4X, 4X and 20X objectives) to provide submicron resolution at large working distances, for a large range of sample sizes
diffraction contrast tomography for unlocking crystallographic information (mapping of grain orientations)
flexible, high contrast imaging for challenging materials—low atomic number (low Z) materials, soft tissue, polymers, fossilized organisms encased in amber, and other materials of low contrast
in-situ-stage to characterize the microstructure of materials in native-like environments (under variation of pressure, tensile or temperature) as well as the evolution of properties over time (4D)
In-situ capabilities
Mechanical in-situ test stage
Correlated workflow
A correlated workflow from XRM to SEM (Auriga 40, IMSAS) in terms of sample positioning / localized analyses is possible via the Atlas software (ZEISS)