3D Materials Analytics

Xradia 520 Versa

General information

Investigation area

3D Materials Analytics
Techniques

3D X-ray Microscopy
Manufacturer

ZEISS
Fabrication year

2016
Measured quantity

True 3D spatial arrangement of X-ray absorption in the sample
Main application

Non-destructive testing, characterization of the 3D microstructure of industrial or geologic materials, biologic tissues etc.
In-situ, real-time compatible

Yes
Correlated workflow available

Yes
Facility

Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Technical aspects

Two-stage geometric and optical magnification based on high resolution optics, (0.4X, 4X and 20X objectives) to provide submicron resolution at large working distances, for a large range of sample sizes

Diffraction contrast tomography for unlocking crystallographic information (mapping of grain orientations)

Phase contrast imaging for challenging materials of low atomic number (low Z) materials: soft tissue, polymers, fossilized organisms encased in amber, and other materials of low contrast

In-situ-stage to characterize the microstructure of materials in native-like environments (under variation of pressure, tensile or temperature) as well as the evolution of properties over time (4D).
In-situ capabilities

Mechanical in-situ test stage: Deben CT5000TEC
Correlated workflow

A correlated workflow for the transfer of mounted samples from XRM to SEM imaging (all SEM on campus) is available. A correlated workflow for the transfer of mounted samples between XRM and NMR is available.