Omicron STM/XPS/LEED

General information

Investigation area
Spectroscopy
Techniques
Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Manufacturer
Omicron
Fabrication year
2012
Measured quantity
3D topography; surface structure; chemical composition
Main application
structural, morphological, and chemical surface characterization of epitaxial thin films and single crystals
In-situ, real-time compatible
Yes

Technical aspects
Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined);
The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean;
For in-situ sample treatment, the maximum scan area of the STM is 1000 nm X 1000 nm;
The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.
In-situ capabilities
Electron beam and direct resistive heating options as well as argon sputtering are available.
Additional measurement possibilities
The instrument provides scanning tunneling microscopy/spectroscopy (STM/STS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) under ultra-high vacuum (UHV).

Application scientist
Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Phone number 62248
krisponeitprotect me ?!ifp.uni-bremenprotect me ?!.de
Jens Falta
Fachbereich 1
NW 1, W4190
Phone number 62244
faltaprotect me ?!ifp.uni-bremenprotect me ?!.de
Principal investigator
Jens Falta

Updated by: MAPEX