Omicron STM/XPS/LEED

Allgemeine Informationen

Untersuchungsgebiete
Spectroscopy
Techniken
Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Hersteller
Omicron
Herstellungsjahr
2012
Gemessene Größe
3D topography; surface structure; chemical composition
Hauptanwendung
structural, morphological, and chemical surface characterization of epitaxial thin films and single crystals
In-situ, real-time kompatibel
Ja

Technische Aspkete
Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined);
The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean;
For in-situ sample treatment, the maximum scan area of the STM is 1000 nm X 1000 nm;
The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.
In-situ-Möglichkeiten
Electron beam and direct resistive heating options as well as argon sputtering are available.
Weitere Untersuchungsmöglichkeiten
The instrument provides scanning tunneling microscopy/spectroscopy (STM/STS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) under ultra-high vacuum (UHV).

Anwendungswissenschaftler
Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Telefonnummer 62248
krisponeitprotect me ?!ifp.uni-bremenprotect me ?!.de
Jens Falta
Fachbereich 1
NW 1, W4190
Telefonnummer 62244
faltaprotect me ?!ifp.uni-bremenprotect me ?!.de
Führender Anwendungswissenschaftler
Jens Falta

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