Instrument Database
X-ray laboratory
General information
- Investigation area
- TechniquesPowder X-ray Diffraction
- ManufacturerVarious
- Measured quantityresidual stresses, phase analyses, determination of retained austenite amount, texture measurements
- In-situ, real-time compatibleYes
Instrument specification
- Technical aspects
12 Chi-diffractometer, therefrom 3 with position sensitive detector (10 with Cr-Kα, 2 with Cu-Kα radiation)
1 ETA diffractometer with position sensitive detector for phase analyses, residual stress and texture measurements at large samples (Cr-kα radiation, other radiations also possible)
1 diffractometer for high resolution phase analyses (Cu-Kα with secondary monochromator)
1 diffractometer for rapid in situ investigations during heat treatment with rotating anode, 2D-Detector and focussing optic (possible radiation: Cu- Kα, Co-kα, Cr-kα)
1 diffractometer with 2D-Detector for in-situ mechanical testing (rotating anode, possible radiation: Cu- Kα, Co-kα, Cr-kα)
2 mobile diffractometers with Cr-Kα radiation for residual stress measurements at very large samples and measurements on site (conventional method and cos-alpha method) - In-situ capabilities
Contact
- Application scientist
- Principal investigatorRainer Fechte-Heinen
Instrument location
- InstituteIWT