Instrument Database

X-Ray Diffraction

X-ray laboratory

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General information

  • Investigation area
  • Techniques
    Powder X-ray Diffraction
  • Manufacturer
  • Measured quantity
    residual stresses, phase analyses, determination of retained austenite amount, texture measurements
  • In-situ, real-time compatible

Instrument specification

  • Technical aspects

    12 Chi-diffractometer, therefrom 3 with position sensitive detector (10 with Cr-Kα, 2 with Cu-Kα radiation)
    1 ETA diffractometer with position sensitive detector for phase analyses, residual stress and texture measurements at large samples (Cr-kα radiation, other radiations also possible)
    1 diffractometer for high resolution phase analyses (Cu-Kα with secondary monochromator)
    1 diffractometer for rapid in situ investigations during heat treatment with rotating anode, 2D-Detector and focussing optic (possible radiation: Cu- Kα, Co-kα, Cr-kα)
    1 diffractometer with 2D-Detector for in-situ mechanical testing (rotating anode, possible radiation: Cu- Kα, Co-kα, Cr-kα)
    2 mobile diffractometers with Cr-Kα radiation for residual stress measurements at very large samples and measurements on site (conventional method and cos-alpha method)

  • In-situ capabilities


Instrument location

  • Institute
Updated by: MAPEX