Allgemeine Informationen

• Untersuchungsgebiete

  X-Ray Diffraction
• Techniken

  Powder X-ray Diffraction
  
• Hersteller

  Various
• Gemessene Größe

  residual stresses, phase analyses, determination of retained austenite amount, texture measurements
• In-situ, real-time kompatibel

  Ja

Spezifikationen des Geräts

• Technische Aspkete

  12 Chi-diffractometer, therefrom 3 with position sensitive detector (10 with Cr-Kα, 2 with Cu-Kα radiation)
  1 ETA diffractometer with position sensitive detector for phase analyses, residual stress and texture measurements at large samples (Cr-kα radiation, other radiations also possible)
  1 diffractometer for high resolution phase analyses (Cu-Kα with secondary monochromator)
  1 diffractometer for rapid in situ investigations during heat treatment with rotating anode, 2D-Detector and focussing optic (possible radiation: Cu- Kα, Co-kα, Cr-kα)
  1 diffractometer with 2D-Detector for in-situ mechanical testing (rotating anode, possible radiation: Cu- Kα, Co-kα, Cr-kα)
  2 mobile diffractometers with Cr-Kα radiation for residual stress measurements at very large samples and measurements on site (conventional method and cos-alpha method)

• In-situ-Möglichkeiten

Kontaktperson

• Anwendungswissenschaftler

  Jérémy Epp
  , IWT
  
  Telefonnummer 0421 218-51335
  eppprotect me ?!iwt-bremenprotect me ?!.de
• Führender Anwendungswissenschaftler

  Rainer Fechte-Heinen
  

Gerätestandort

• Institut (Außeruniversitär)

  IWT