Instrument Database
Electron Microscopy
Supra 40
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General information
- Investigation area
- TechniquesScanning Electron Microscopy
- ManufacturerZeiss
- Fabrication year2008
- Measured quantitysurface morphology, composition, particle sizes
- Main applicationMaterials Chemistry and Mineralogy / Materials Analysis
Instrument specification
- Technical aspects
The FE-SEM is equipped with various detectors (SE2 / Inlens / BSD) and provides conclusions about the topography and material composition of the sample.
The Bruker EDS detector XFlash 6|30 has an active surface of 30 mm2 and an energy resolution of <129 eV at Mn-Kα. Due to the high pulse rates, single point analysis, area analysis as well as linear analysis (line scan) and element mapping are possible within the shortest measurement time.
Contact
- Application scientist
- Principal investigatorWolfgang Bach
Instrument location
- GroupAG Petrologie der Ozeankruste
- BuildingGEO
- Room2216
- FacultyFachbereich 5