General information

• Investigation area

  Electron Microscopy
• Techniques

  Scanning Electron Microscopy
  
• Manufacturer

  Zeiss
• Fabrication year

  2008
• Measured quantity

  surface morphology, composition, particle sizes
• Main application

  Materials Chemistry and Mineralogy / Materials Analysis

Instrument specification

• Technical aspects

  The FE-SEM  is equipped with various detectors (SE2 / Inlens / BSD) and provides conclusions about the topography and material composition of the sample. The Bruker EDS detector XFlash 6|30 has an active surface of 30 mm2 and an energy resolution of <129 eV at Mn-Kα. Due to the high pulse rates, single point analysis, area analysis as well as linear analysis (line scan) and element mapping are possible within the shortest measurement time.

Contact

• Application scientist

  Witte, Petra
  Fachbereich 5
  
  Phone number 65156
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• Principal investigator

  Wolfgang Bach
  

Instrument location

• Group

  AG Petrologie der Ozeankruste
• Building

  GEO
• Room

  2216
• Faculty

  Fachbereich 5