General information

• Investigation area

  X-Ray Diffraction
• Techniques

  Single-crystal X-ray Diffraction
  
• Manufacturer

  Bruker
• Fabrication year

  2011
• Measured quantity

  Unit cell of single crystals; Orientation of single crystals; X-ray diffraction (XRD) data for single crystal structure analysis
• Main application

  Single crystal diffraction for crystal structure analysis
• In-situ, real-time compatible

  Yes
• Facility

  Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Instrument specification

• Technical aspects

  Fast 4- circle Kappa-diffractometer with monochromatic Mo K_alpha radiation and 2D detector .
  Typically complete difraction data sets may be obtained for crystal structure analysis of single crystals of about 100-400 µm diameter .
  Determination of orientation only is also possible for large crystals up to several mm. Extremely small amounts of powder may be subject to rotation measurements to achieve powder patterns ( however , with rather low resolution in reflection widths ) - usually use powder XRD for small samples due to better resolution .

• In-situ capabilities

  Typical single crystals may be subjected to non-ambient temperature (not routine, no calibration yet, Sept. 2024) from -100 to 1000°C.

Contact

• Application scientist

  Johannes Birkenstock
  Fachbereich 5
  Geo 2300
  Phone number 042121865165
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• Lars Robben
  Fachbereich 2 , IACK
  NW2/C3051
  Phone number 63142
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• Principal investigator

  Thorsten Gesing
  Ella M. Schmidt
  

Instrument location

• Group

  Crystallography & Geomaterials
• Building

  GEO
• Room

  2410
• Faculty

  Fachbereich 5