Infrastructure

The database facilitates scientific work by offering a searchable list of analytical equipment available in the group of MAPEX members. The online database is aimed at making it easier for students, university employees as well as external researchers to learn about analytical methods and get in contact with the responsible Instrument operators. You can easliy browse through the predefined categories or perform keyword and text searches.

Scanning Electron Microscope

Creep testing machine

NDT

Fatigue testing machine

Acoustic emission testing

Dr. Guilherme Dalla Lana Semione

Phone: +49 421 218 64573
E-Mail: semioneprotect me ?!uni-bremenprotect me ?!.de

registration form (Excel)

Principal Investigator

Andreas Rosenauer

All classic categories

Electron Microscopy

Surface Analytics

Spectroscopy

Diffraction

Characterization

Software Licences

Preparation

Testing

Microscopy

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Mechanical testing

Damage analysis

non-ambient X-ray powder diffraction

Structure characterization

in-situ reaction studies

3D microscopy

3D X-ray microscopy

All MAPEX categories

Surface / Interface Characterization

Near- / Subsurface Properties

Material Properties

Dimensional Properties

Instrument	Manufacturer	Category	Contact
(S)TEM	FEI	Diffraction Microscopy Spectroscopy Electron Microscopy Dimensional Properties Surface / Interface Characterization Material Properties	Thorsten Mehrtens Marco Schowalter
3D Laser Lithography	Nanoscribe	--- Material Properties Surface / Interface Characterization Dimensional Properties	Claas Falldorf
3D Profilometer	Sensofar-Tech, S.L.	Microscopy Dimensional Properties	Jürgen Horvath
Acoustic Emission	Vallen Systeme GmbH	Damage analysis Material Properties	Renato Almeida
AFM	JPK Berlin Germany	Microscopy Surface Analytics Spectroscopy Surface / Interface Characterization Material Properties Dimensional Properties	Gang Wei Jingfeng Li
Axioplan	Zeiss	--- Surface / Interface Characterization	Johanne Hesselbach Manuel Hahn
Axioskop	Zeiss	--- Surface / Interface Characterization	Johanne Hesselbach Manuel Hahn
BET	MicrotracBEL Corp.	Surface Analytics Surface / Interface Characterization	Prabu Moni
BSM	Malvern	Diffraction Dimensional Properties	Daniel Schwenck Nevaf Ciftci
CD spectrometer	Applied Photophysics	Spectroscopy Surface / Interface Characterization	Monika Michaelis
Confocal microscope	Keyence	Microscopy Surface Analytics Dimensional Properties Material Properties Surface / Interface Characterization	Claas Falldorf Reiner Klattenhoff
Creep testing machine	Zwick	Mechanical testing Material Properties	Jürgen Horvath Renato Almeida
DMA	TA Instruments	--- Material Properties Dimensional Properties	Johanne Hesselbach Manuel Hahn
DSC	TA Instruments	--- Material Properties	Johanne Hesselbach Manuel Hahn
E-beam lithography	Raith	--- Material Properties Dimensional Properties Surface / Interface Characterization	Reiner Klattenhoff
EMPA	JEOL	Microscopy Surface Analytics Spectroscopy Surface / Interface Characterization Near- / Subsurface Properties	Andree Irretier
FastScanning AFM	Bruker	Microscopy Surface Analytics Surface / Interface Characterization Material Properties	Andreas Lüttge Cornelius Fischer
Fatigue testing machine	Roell Amsler	Mechanical testing Material Properties	Renato Almeida Jürgen Horvath
FIB	Zeiss	Electron Microscopy Surface / Interface Characterization Near- / Subsurface Properties Dimensional Properties	Reiner Klattenhoff
FT-Raman	Bruker	Spectroscopy Material Properties Near- / Subsurface Properties Dimensional Properties	Mangir M. Murshed
FTIR	Bruker	Spectroscopy Material Properties	Mangir M. Murshed
G3	Malvern	Microscopy Dimensional Properties	Nils Ellendt Daniel Schwenck
Gleeble 3500	Dynamic Systems	--- Material Properties	Andree Irretier Münip Dalgic
He pygnometer	Porotec	--- Material Properties	Tina Kühn
Hg porosimeter	POROTEC GmbH	--- Material Properties	Tina Kühn
Inspekt 100	Hegewald & Peschke	Surface Analytics Material Properties	Michael Brink Michael Vogel
IPDS	Stoe & Cie	Diffraction Material Properties	Lars Robben
Laser Flash Unit	NETZSCH-Gerätebau GmbH	Characterization Material Properties	Christian Ellenberg
LEEM	Elmitec	Diffraction Microscopy Electron Microscopy Surface / Interface Characterization	Dr. Jon-Olaf Krisponeit Jens Falta
LFA 457	Netzsch	--- Material Properties	Johanne Hesselbach Manuel Hahn
M420	Wild	--- Surface / Interface Characterization	Johanne Hesselbach Manuel Hahn
NDT	GrindoSonic	Mechanical testing Material Properties	Jürgen Horvath Renato Almeida
Raman	Horiba Jobin Yvon	Spectroscopy Material Properties Near- / Subsurface Properties Dimensional Properties	Mangir M. Murshed
Rheometer	TA Instruments	--- Material Properties Dimensional Properties	Johanne Hesselbach Manuel Hahn
Rheometer DHR-3	TA Instruments	--- Material Properties Surface / Interface Characterization	Michael Maas Joeri Smits
Rheometer Kinexus	Malvern	--- Material Properties	Michael Maas Jéssica Condi Mainardi
SEM	Zeiss	Surface Analytics Surface / Interface Characterization Dimensional Properties	Eva-Maria Meyer Daniel Gräbner
SEM	Jeol	Microscopy Material Properties Surface / Interface Characterization Near- / Subsurface Properties	Lars Robben
Spectrometry Lab		Characterization Surface / Interface Characterization	Jérémy Epp
STA	Netzsch	--- Material Properties	Michael Wendschuh
STA	Bähr-Thermoanalyse GmbH	--- Material Properties	Daniel Schumacher Tina Kühn
StadiP	Stoe & Cie	Diffraction Material Properties	Lars Robben
STM/XPS/LEED	Omicron	Microscopy Characterization Diffraction Surface / Interface Characterization Near- / Subsurface Properties Dimensional Properties	Jens Falta Jon-Olaf Krisponeit
SurPASS	Anton Paar	Surface Analytics Material Properties Surface / Interface Characterization	Marieke Hoog Antink Joeri Smits
TGA	Eltra	--- Material Properties	Johanne Hesselbach Manuel Hahn
TMA	TA Instruments	--- Material Properties Dimensional Properties	Johanne Hesselbach Manuel Hahn
VSI-R	Bruker/Renishaw	Surface Analytics Spectroscopy Microscopy Surface / Interface Characterization Material Properties	Andreas Lüttge Cornelius Fischer
X-ray CT	GE	--- Material Properties Dimensional Properties Surface / Interface Characterization	Christian Kapitza
X-Ray Lab		Diffraction Near- / Subsurface Properties Material Properties	Jérémy Epp
X-Ray Powder	Stoe & Cie GmbH, Darmstadt	Diffraction Structure characterization non-ambient X-ray powder diffraction in-situ reaction studies Surface / Interface Characterization Material Properties	Lars Robben
XRD powder	GE Sensing & Inspection Technologies GmbH	Diffraction Near- / Subsurface Properties Material Properties	Marieke M. Hoog Antink Christian Ellenberg
XRD powder	Bruker	Diffraction Near- / Subsurface Properties Material Properties	Michael Wendschuh Johannes Birkenstock
XRD powder	Panalytical	Diffraction Near- / Subsurface Properties Material Properties	Michael Wendschuh Johannes Birkenstock
XRD single crystal	Bruker	Diffraction Near- / Subsurface Properties Material Properties	Enno Lork
XRD single crystal	Bruker	Diffraction Near- / Subsurface Properties Material Properties	Johannes Birkenstock Michael Wendschuh
XRM	ZEISS	3D X-ray microscopy Material Properties Dimensional Properties Surface / Interface Characterization	Wolf-Achim Kahl
Z 250	Zwick	--- Material Properties	Johanne Hesselbach Manuel Hahn
Z005	Zwick	Mechanical testing Material Properties	Renato Almeida Jürgen Horvath
Zetasizer	Malvern	Surface Analytics Dimensional Properties Surface / Interface Characterization	Michael Maas Joeri Smits

Updated by: MAPEX

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Infrastructure

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Principal Investigator