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New MAPEX Postcard - 15

This atomic force microscopy image shows the topography of a periodical nanostructure with sinusoidal height distribution. Width of each yellow column about 100 nm.

Alexe et al., Applied Optics 57, 92 - 101 (2018).

 

associated with MAPEX Research Highlight 2018:

Model-assisted measuring method for periodical sub-wavelength nanostructures

Authors:

G.Alexe, A.Tausendfreund, D. Stöbener, A. Fischer

Journal:

Applied Optics (2018) 57, 92-101.

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Aktualisiert von: MAPEX