Instrument Database
Electron Microscopy
JSM-6510 SEM
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General information
- Investigation area
- TechniquesScanning Electron Microscopy
- ManufacturerJeol
- Fabrication year2011
- Main applicationScanning Electron Microscopy
Instrument specification
- Technical aspects
SE and BE detectors;
EDX detector for quantitative chemical analysis;
Jeol JSM-6510 Scanning Electron Microscope with W-emitter (maximum resolution 3 nm @ 30 kV);
Detectors: Secondary electrons; backscattered electrons;
Bruker X-Flash solid state detector for X-ray spectroscopy, enabling qualitative and quantitative analysis, analysis along line profiles and sample mapping.
Contact
- Application scientistLars Robben
Fachbereich 2 , IACK
NW2/C3051
Phone number 63142
lrobbenprotect me ?!uni-bremenprotect me ?!.de - Principal investigatorThorsten Gesing
Instrument location
- GroupChemische Kristallographie fester Stoffe
- BuildingNW2
- RoomC3230
- FacultyFachbereich 2
- InstituteIACK