General information

• Investigation area

  Electron Microscopy
• Techniques

  Transmission Electron Microscopy
  
• Manufacturer

  FEI
• Fabrication year

  2007
• Measured quantity

  Morphological quantities, Elemental distribution, Strain distribution
• Main application

  (Scanning) transmission electron microscopy
• In-situ, real-time compatible

  Yes
• Correlated workflow available

  Yes

Instrument specification

• Technical aspects

  Electron energy loss spectrometer;

  EDX detector and HAADF detectors;

  Tomography holder;

  Heating(RT-1000°C)/cooling(lN2-70°C) holder;

  Electron biprism

   

• In-situ capabilities

  Temperatures (RT-1000°C, lN2-70°C), Electrical biasing
• Correlated workflow

  Correlation with FIB/SEM and any other technique that allows marking of specimen positions for FIB/SEM

Contact

• Application scientist

  Thorsten Mehrtens
  Fachbereich 1
  NW1, M4190
  Phone number 0421/218/62273
  mehrtensprotect me ?!ifp.uni-bremenprotect me ?!.de
• Marco Schowalter
  Fachbereich 1
  NW1, M4180
  Phone number 042121862263
  schowalterprotect me ?!ifp.uni-bremenprotect me ?!.de
• Principal investigator

  Andreas Rosenauer
  

Instrument location

• Group

  AG Rosenauer
• Building

  NW1
• Room

  O0050
• Faculty

  Fachbereich 1
• Institute University

  IFP