Surface Analytics| Electron Microscopy|
Surface Analytics
Surface Analytics
Raman coupled Vertical Scanning Interferometry (Rc-VSI) is a sophisticated non-contact and minimally invasive technology that allows the investigation of material's surface topographies and composition. By using white light, it is also possible to measure time-dependent changes of the topographies (reaction rates) and their chemistry spatially resolved. Rc-VSI provides a large field of view with a high vertical resolution (typically 1 nm) and can measure topography changes up to 100 microns. Complementary (fast-scan) and high-resolution AFM measurements are possible.
What kind of result do I get?
Rc-VSI produces spatially resolved topographic maps of (almost) any reflective material surface. Data can be used to generate (dissolution/corrosion, and growth/deposition) rate maps in units of [mol/m2/s] and rate spectra, i.e., frequency spectra of the observed rates. The topographic and rate maps can be overlaid precisely with spatially resolved Raman maps of the surface chemistry (and its changes). These data can be complemented with fast-scan and high-resolution AFM measurements.
Area responsible
Prof. Dr. rer. nat. habil. Andreas Lüttge
Klagenfurter Str. 2-4, D-28359 Bremen
Phone: +49 421 218 65233
Email: aluttgeprotect me ?!uni-bremenprotect me ?!.de ;
aluttgeprotect me ?!marumprotect me ?!.de
Application Scientist
Marcos Toro Cadavid
Lab Manager Surface Analytics
MAPEX Center for Materials and Processes
University of Bremen
Klagenfurter Str. 2-4, D-28359 Bremen
Phone: +49 421 218 65229
Email: mtoroprotect me ?!uni-bremenprotect me ?!.de
Our key instruments
© Marcos Toro / Universität Bremen
Rc-VSI Bruker / Renishaw
Raman spectroscope coupled with Vertical Scanning Interferometer
- Raman equipped with 785 nm and 532 nm class 3B lasers
- Interferometer equipped with 5x; 20x; 50x; 115x objectives
- White light scanning and monochromatic phase shift modes available
© Marcos Toro / Universität Bremen
Bruker Dimension Fast Scan AFM
Atomic force microscope
- Fast scans can reach> 125 Hz in air or fluid environments
- Scan range of 90 µm x 90 µm with a height range of up to 10 µm
- Reduced noise level: <0.2 nm in-plane and <50 pm out-of-plane
© Gang Wei / Universität Bremen
JPK Nanowizard III
Atomic force microscope
- Sub-nm resolution
- Compatible with liquid and biological samples
- Force spectroscopy mode available
Research Highlights
Surface Analytics| Electron Microscopy|
Sputter-Deposited β-Ga₂O₃ Films With Al Top Electrodes for Resistive Random Access Memory Technology
© The Authors, https://doi.org/10.1016/j.gca.2021.06.032, licensed under CC BY-NC-ND 4.0
Surface Analytics|