General information

• Investigation area

  3D Materials Analytics
• Techniques

  X-ray computed tomography
  
• Manufacturer

  GE
• Fabrication year

  2014
• Measured quantity

  3D-shape; defects; interfaces; volume
• Main application

  Non destructive testing (NDT) of metals, compound materials, opto-electronic components, etc.

Instrument specification

• Technical aspects

  Max. object size: (height x diameter) 600 mm x 500 mm

  Max. scan range: (height x diameter) 290 mm x 400 mm

  nanofocus x-ray tube - 180 kV / 15 W,  < 1 µm  resolution (for 2mm sample diameter) 

  microfocus x-ray tube - 240 kV / 320 W, > 3 µm  resolution / transmission < 40 mm steel

• Additional measurement possibilities

  Talbout-Lau-Graitung-Interferometer

Contact

• Application scientist

  Christian Kapitza
  
  FZB / BIAS
  Phone number 218-58034
  kapitzaprotect me ?!biasprotect me ?!.de
• Oliver Focke
  , FIBRE
  IW 3
  Phone number 218-58655
  fockeprotect me ?!faserinstitutprotect me ?!.de
• Principal investigator

  Bergmann, Ralf
  Herrmann, Axel
  

Instrument location

• Group

  FIBRE/BIAS
• Building

  Ecomat