Instrument Database

MAPEX Instrument Database

Find your analysis

Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).

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  • Instrument
    Manufacturer
    Investigation area
    Technique
    Transmission Electron Microscopy
    Key features
    Aberration corrector for imaging lens; In-situ heating and cooling
    Contact
    Thorsten Mehrtens
    mehrtens@ifp.uni-bremen.de
    Marco Schowalter
    schowalter@ifp.uni-bremen.de
  • Instrument
    Manufacturer
    Investigation area
    Technique
    3D X-ray Microscopy
    Key features
    High contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolution
    Contact
    Wolf-Achim Kahl
    wakahl@uni-bremen.de
  • Instrument
    Manufacturer

    Spectra 300

    ThermoFisher Scientific
    Investigation area
    Technique
    Transmission Electron Microscopy
    Key features
    In-situ heating and cooling; EDX detector; Electrical biasing
    Contact
    Thorsten Mehrtens
    mehrtens@ifp.uni-bremen.de
    Marco Schowalter
    schowalter@ifp.uni-bremen.de
  • Instrument
    Manufacturer

    FlexPL

    Various
    Investigation area
    Technique
    Low temperature photoluminescence
    Raman spectroscopy
    Key features
    High flexibility: This is a fully customized setup for advanced spectroscopy. Thus, it can be modified to individual needs. This is not a "black-box" system as sold be various companies.
    Contact
    Jana Lierath
    lierath@uni-bremen.de
    Gordon Callsen
    gcallsen@uni-bremen.de
  • Instrument
    Manufacturer

    Complex Irradiation Facility

    DLR Bremen, Institute of Space Systems
    Investigation area
    Technique
    Space Environment Testing
    Key features
    Experimental research into the degradation of materials under simulated space radiation conditions
    Contact
  • Instrument
    Manufacturer

    Micro-VCM Teststand

    DLR Bremen
    Investigation area
    Technique
    Outgassing testing
    Key features
    Thermal vacuum outgassing test for the screening of space materials.
    Contact
    Andreas Witzke
    andreas.witzke@dlr.de
  • Instrument
    Manufacturer
    Investigation area
    Technique
    Laser Metal Deposition
    Key features
    High-throughput generation of materials samples
    Contact
  • Instrument
    Manufacturer

    LEAP 5000 XR

    Cameca
    Investigation area
    Technique
    Atom Probe Tomography
    Key features
    Atom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.
    Contact
    Belkacemi, Lisa
    belkacemi@iwt-bremen.de
    Jérémy Epp
    epp@iwt-bremen.de
  • Instrument
    Manufacturer
    Technique
    Thermal programmed desorption
    Photoemission spectroscopy
    Low-energy Electron Diffraction
    Key features
    -
    Contact
    Karg, Alexander
    karg@ifp.uni-bremen.de
    Eickhoff, Martin
    martin.eickhoff@uni-bremen.de
  • Instrument
    Manufacturer

    Quattro S

    Thermo Fisher Scientific
    Technique
    Scanning Electron Microscopy
    Thermomechanical Analysis
    Key features
    Environmental scanning of biological materials at low vacuum (up to 2000 pa) and different humidity and/or temperature conditions.
    Contact
  • Instrument
    Manufacturer

    AMSY-6

    Vallen Systeme GmbH
    Investigation area
    Technique
    Acoustic Emission
    Key features
    4 acoustic emission channels with sampling rate of up to 40 MS/s
    Contact
  • Instrument
    Manufacturer
    Investigation area
    Technique
    Ellipsometry
    Key features
    Fully automated ellipsometry, with layer modelling and fitting. Simultaneous multiple parameter determination.
    Contact
    Jana Lierath
    lierath@uni-bremen.de
  • Instrument
    Manufacturer
    Investigation area
    Technique
    Photoluminescence Quantum Yield
    Key features
    Can be used for a variarity of samples (multilayer samples, powder samples, liquids, etc.). Easy to use: drawer insertion to the Fluorolog and connection to the Fluorlog system.
    Contact
    Jana Lierath
    lierath@uni-bremen.de
  • Instrument
    Manufacturer

    Thinky Mixer ARV-310P

    Thinky U.S.A., INC.
    Investigation area
    Technique
    Mixer
    Key features
    Simultaneous mixing, dispersion, and submicron-level air bubble elimination; deaeration of high-viscosity materials difficult to be processed by a centrifugal separator; reduced processing time and improved deareation performance compared to atmospheric type mixer; centrifugal force of revolution prevents overflow of material during operation
    Contact
    Fabio La Mantia
    lamantia@uni-bremen.de
    Jan Wedemeier
    matena@uni-bremen.de
  • Instrument
    Manufacturer

    TOMCAT

    Supermicro / NVIDIA
    Investigation area
    Technique
    GPU Computing / 3D-4D Tomography Visualization & Analysis
    Key features
    High-performance GPU server with 4x NVIDIA L40S GPUs (Ada Lovelace, 48 GB GDDR6 ECC VRAM each, 192 GB total) for accelerated 3D/4D visualization, deep learning, and CT reconstruction. 1 TB DDR5-6400 RAM for in-memory processing of terabyte-scale datasets. 15.36 TB NVMe SSD storage. Dragonfly 3D World for AI-driven segmentation, quantification, and scientific visualization. Remote access via web-based tools for cross-faculty collaboration. FAIR-compliant data workflows using open formats (OME-TIFF, Zarr).
    Contact
    Oliver Plümper
    pluemper@uni-bremen.de
    Wolf-Achim Kahl
    wakahl@uni-bremen.de
Updated by: MAPEX