Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
- Instrument
ManufacturerOmicron STM/XPS/LEED
OmicronInvestigation areaTechniqueScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron MicroscopyKey featureshigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsContact - Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron MicroscopyKey featuresIn-situ heating and cooling; EDX detector; Electrical biasingContact - Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron MicroscopyKey featuresAberration corrector for imaging lens; In-situ heating and coolingContact - Instrument
ManufacturerX-ray powder diffractometer Stadi MP
Stoe & Cie GmbHInvestigation areaTechniquePowder X-ray DiffractionKey featuresIn-situ heating and cooling; Monochromized Mo radiation; Fast data collectionContact - Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray DiffractionKey featuresmonochromatic Mo K_alphaContact - Instrument
ManufacturerX-ray laboratory
VariousInvestigation areaTechniquePowder X-ray DiffractionKey featuresSeveral diffractometers with different X-ray sources and capabilitiesContact - Instrument
ManufacturerXRD 3003
GE Sensing & Inspection Technologies GmbHInvestigation areaTechniquePowder X-ray DiffractionKey featuresPowder diffractometerContact - Instrument
ManufacturerBruker D8 Advance
BrukerInvestigation areaTechniquePowder X-ray DiffractionKey featuresBragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and coolingContact - Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray DiffractionKey featuresIn-situ measurements from 100 K to 293 KContact - Instrument
ManufacturerX'Pert Pro
PanalyticalInvestigation areaTechniquePowder X-ray DiffractionKey featuresSample changer for batch measurement of up to 16 samplesContact - Instrument
ManufacturerSkyScan 1275
BrukerInvestigation areaTechnique3D X-ray MicroscopyKey featuresEasy to use, high resolution 3D X-ray microtomography and structure reconstructionContact - Instrument
ManufacturerSupra 40
ZeissInvestigation areaTechniqueScanning Electron MicroscopyKey featuresThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Contact - Instrument
ManufacturerDimension Icon XR
BrukerInvestigation areaTechniqueAtomic Force MicroscopyKey features-Contact