MAPEX Instrument Database
IPDS
General information
Description
Imaging Plate Detection System
Manufacturer
Stoe & Cie
Location
Fachbereich 2
IACK
Chemische Kristallographie fester Stoffe NW2 C3240
IACK
Chemische Kristallographie fester Stoffe NW2 C3240
Category
Diffraction
MAPEX Category
Material Properties
Keywords
single crystal diffraction, XRD
Measured Quantity
h,k,l,I
Main Application
Single Crystal structure solution / refinement
Features
high temperature measurements possible
Contact
Contact person
Lars Robben
Fachbereich 2 / IACK
NW2/C3051
Phone 63142
lrobben@uni-bremen.de
Principal Investigator
Gesing, Thorsten
Fischer, Reinhard X.
Fischer, Reinhard X.