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MAPEX Instrument Database

STM/XPS/LEED

General information

Description
Omicron VT-STM
Manufacturer
Omicron
Location
Fachbereich 1
IFP
Prof. Falta NW 1 M0060
Category
Microscopy, Characterization, Diffraction
MAPEX Category
Surface / Interface Characterization, Near- / Subsurface Properties, Dimensional Properties
Keywords
surface analysis, STM, XPS, LEED
Measured Quantity
3D topography; surface structure; chemical composition
Main Application
structural, morphological and chemical surface characterization of epitaxial thin films and single crystals
Features
high resolution, in-situ ability of complementary methods under ultra-high vacuum conditions

Instrument specification

Specifications

The instrument provides scanning tunneling microscopy/spectroscopy (STM/STS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) under ultra-high vacuum (UHV). Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined). The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean. For in-situ sample treatment, electron beam and direct resistive heating options as well as argon sputtering are available. The maximum scan area of the STM is 1000 nm X 1000 nm. The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.

Contact

Contact person

Jens Falta
Fachbereich 1
NW 1, W4190
Phone 62244
falta@ifp.uni-bremen.de
ifp.uni-bremen.de

Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Phone 62248
krisponeit@ifp.uni-bremen.de
ifp.uni-bremen.de

Principal Investigator
Falta, Jens
Updated by: MAPEX