The instrument provides scanning tunneling microscopy/spectroscopy (STM/STS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) under ultra-high vacuum (UHV). Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined). The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean. For in-situ sample treatment, electron beam and direct resistive heating options as well as argon sputtering are available. The maximum scan area of the STM is 1000 nm X 1000 nm. The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.

Jens Falta
Fachbereich 1
NW 1, W4190
Phone 62244
falta@ifp.uni-bremen.de
ifp.uni-bremen.de

Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Phone 62248
krisponeit@ifp.uni-bremen.de
ifp.uni-bremen.de