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MAPEX Instrument Database

3D Profilometer

General information

Description
PLµ2300 Sensofar
Manufacturer
Sensofar-Tech, S.L.
Location
Fachbereich 4
Adv. Ceramics IW3 2380
Category
Microscopy
MAPEX Category
Dimensional Properties
Keywords
Confocal microscopy, Interferometer microscope, Surface finish, Topography, Roughness, Profilometry
Measured Quantity
3D topography; Surface roughness
Main Application
Surface structures, Ceramic production
Features
Confocal conventional and interferometer microscope
Year of Fabrication
2008

Instrument specification

Specifications

surface topography, surface roughness. Horizontal resolution: 0,3-4,7µm. Vertical resulotion: confocal 1nm, interferometer 0,1nm. Horizontal measuring range: confocal 1,9x2,5 mm, interferometer 3,8x5,1 mm, depends on Objectiv. Verical measuring range: confocal 50mm, interferometer 100µm. Objective: confocal 10x, 20x, 50x, 150x, interferometer 10x, 50x.

Contact

Contact person

Jürgen Horvath
Fachbereich 4
IW3 / 2150
horvath@uni-bremen.de
http://www.ceramics.uni-bremen.de/

Principal Investigator
Rezwan, Kurosch
Updated by: MAPEX