Veröffentlichungen
high voltage M Hanf, JH Peters, S Clausner, N Kaminski Microelectronics Reliability 138, 114622 Aluminium corrosion in power semiconductor devices J Leppänen, J Ingman, JH Peters, M Hanf, R Ross, G Koopmans [...] Berichtszeitraum: 01.10. 2017 bis 30.06. 2022 W Holzke, J Adler, M Hanf, A Ernst, D Koczy, JH Peters, H Lutzen, ... Universität Bremen High temperature materials and reliability testing for WBG power electronics [...] Portoroz, 2006 Joost, M.; Peter, K.; Orlik, B.: ROBUST H8-CONTROL FOR MULTI-MASS SYSTEMS BASED ON A REDUCED MODEL, IFAC Mechatronics 2006, Heidelberg, 2006 Joost, M.; Peter, K.; Orlik, B.: Reduzierte